Inventor · disambiguated record
Mike Berkmyre
Also filed as: BERKMYRE MIKE
5 granted patents·2 pending applications·27 citations·filing 2013–2016
78Inventor score
Top patents by PatentIndex Score
7 records- 0192US9891280B2Probe-based data collection system with adaptive mode of probing controlled by local sample propertiesFEI EFA INC·Filed 2016·Granted Feb 13, 2018·7 cites·13 claims
- 0286US8895923B2System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobingDCG SYSTEMS INC·Filed 2013·Granted Nov 25, 2014·7 cites·20 claims
- 0385US9057740B1Probe-based data collection system with adaptive mode of probingDCG SYSTEMS INC·Filed 2013·Granted Jun 16, 2015·7 cites·20 claims
- 0475US10175295B2Optical nanoprobing of integrated circuitsFEI CO·Filed 2016·Granted Jan 8, 2019·4 cites·33 claims
- 0572US9506947B2System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobingDCG SYSTEMS INC·Filed 2014·Granted Nov 29, 2016·2 cites·18 claims
- 0649US2014380531A1Probe-based data collection system with adaptive mode of probing controlled by local sample propertiesDCG SYSTEMS INC·Filed 2014·Application pending·0 cites
- 0735US2016370425A1Particle Beam Heating to Identify DefectsDCG SYSTEMS INC·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →