Inventor · disambiguated record
Mitsuru Fukuda
Also filed as: FUKUDA MITSURU
17 granted patents·5 pending applications·39 citations·filing 1982–2025
89Inventor score
Files withMITUTOYO CORP9HITACHI INT ELECTRIC INC3KOKUSAI ELECTRIC CORP3FUKUDA MITSURU2MAKITA DAISUKE2
Top patents by PatentIndex Score
22 records- 0189US11274945B2Coordinate measuring machine and coordinate measuring programMITUTOYO CORP·Filed 2020·Granted Mar 15, 2022·4 cites·5 claims
- 0277US4474524ASystem for discharging thermal decomposition residue containing carbon residue and steel wire ballsKOBE STEEL LTD·Filed 1982·Granted Oct 2, 1984·21 cites·12 claims
- 0374US10860005B2Substrate processing apparatus and non-transitory computer-readable recording mediumHITACHI INT ELECTRIC INC·Filed 2017·Granted Dec 8, 2020·2 cites·11 claims
- 0469US8984876B2Industrial machineFUKUDA MITSURU·Filed 2011·Granted Mar 24, 2015·3 cites·11 claims
- 0563US2024149461A1Foolproof device and storage mediumMITUTOYO CORP·Filed 2023·Application pending·0 cites
- 0658US7210239B2Slider device and measuring instrumentMITUTOYO CORP·Filed 2005·Granted May 1, 2007·3 cites·4 claims
- 0758US2025306578A1Simulator apparatus, substrate processing apparatus, simulation method, method of manufacturing semiconductor device and non-transitory computer-readable recording mediumKOKUSAI ELECTRIC CORP·Filed 2025·Application pending·0 cites
- 0857US7249420B2Slider device and measuring instrumentMITUTOYO CORP·Filed 2005·Granted Jul 31, 2007·1 cites·4 claims
- 0951US10830568B2Measurement device and measurement systemMITUTOYO CORP·Filed 2018·Granted Nov 10, 2020·0 cites·9 claims
- 1050US9128147B2Test head, test board and test apparatusMAKITA DAISUKE·Filed 2012·Granted Sep 8, 2015·1 cites·12 claims
- 1150US2013243550A1Substrate Processing Apparatus, Method of Processing Substrate, Method of Manufacturing Semiconductor Device and Non Transitory Computer Readable Recording Medium on which Program for Performing Method of Manufacturing Semiconductor Device is RecordedHITACHI INT ELECTRIC INC·Filed 2013·Application pending·0 cites
- 1248US2016284581A1Method of Manufacturing Semiconductor DeviceHITACHI INT ELECTRIC INC·Filed 2016·Application pending·0 cites
- 1347US10001357B2Coordinate measuring apparatusMITUTOYO CORP·Filed 2016·Granted Jun 19, 2018·0 cites·13 claims
- 1447US7870935B2Traction drive power transmission deviceTHK CO LTD·Filed 2003·Granted Jan 18, 2011·4 cites·4 claims
- 1545US11782425B2Substrate processing apparatus, method of monitoring abnormality of substrate processing apparatus, and recording mediumKOKUSAI ELECTRIC CORP·Filed 2020·Granted Oct 10, 2023·0 cites·12 claims
- 1639US2013185010A1Measurement coordinate correction method and coordinate measuring apparatusMITUTOYO CORP·Filed 2012·Application pending·0 cites
- 1738US10807206B2Measuring apparatus and support mechanism of columnar work pieceMITUTOYO CORP·Filed 2017·Granted Oct 20, 2020·0 cites·10 claims
- 1833US11663562B2Substrate processing apparatus and controllerKOKUSAI ELECTRIC CORP·Filed 2018·Granted May 30, 2023·0 cites·10 claims
- 1933US9310177B2Method of correcting measurement data of a coordinate measuring machine and a coordinate measuring machineFUKUDA MITSURU·Filed 2011·Granted Apr 12, 2016·0 cites·1 claims
- 2025US8924176B2Industrial machineKAWAMURA KANAE·Filed 2011·Granted Dec 30, 2014·0 cites·2 claims
- 2123USD984288SInspection gauge for coordinate measuring machineMITUTOYO CORP·Filed 2021·Granted Apr 25, 2023·0 cites·1 claims
- 2223US9140749B2Test apparatusMAKITA DAISUKE·Filed 2012·Granted Sep 22, 2015·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →