Inventor · disambiguated record
Mishio Hayashi
Also filed as: HAYASHI MISHIO
21 granted patents·2 pending applications·246 citations·filing 1978–2004
95Inventor score
Top patents by PatentIndex Score
23 records- 0176US4901264APseudo random pattern generating deviceADVANTEST CORP·Filed 1988·Granted Feb 13, 1990·23 cites·10 claims
- 0276US4600994APhase difference measuring apparatusTAKEDA RIKEN IND CO LTD·Filed 1983·Granted Jul 15, 1986·28 cites·18 claims
- 0368US6574168B2Time measuring device and testing apparatusADVANTEST CORP·Filed 2001·Granted Jun 3, 2003·11 cites·19 claims
- 0465US4544884APeriod and frequency measuring instrumentTAKEDA RIKEN IND CO LTD·Filed 1983·Granted Oct 1, 1985·15 cites·6 claims
- 0564US5764045AFrequency measuring apparatusADVANTEST CORP·Filed 1996·Granted Jun 9, 1998·26 cites·3 claims
- 0663US4870664AContinuous counting deviceADVANTEST CORP·Filed 1988·Granted Sep 26, 1989·14 cites·10 claims
- 0760US5381100APulse signal measuring instrumentADVANTEST CORP·Filed 1993·Granted Jan 10, 1995·21 cites·6 claims
- 0857US5293520AJitter analyzerADVANTEST CORP·Filed 1992·Granted Mar 8, 1994·18 cites·10 claims
- 0951US5163069APattern synchronizing circuit and methodADVANTEST CORP·Filed 1991·Granted Nov 10, 1992·16 cites·9 claims
- 1048US7495452B2Wire harness checker and wire harness checking methodSUMITOMO WIRING SYSTEMS·Filed 2004·Granted Feb 24, 2009·4 cites·5 claims
- 1147US4611926ATime interval measuring instrumentTAKEDA RIKEN IND CO LTD·Filed 1984·Granted Sep 16, 1986·9 cites·18 claims
- 1244US4878233AData pattern synchronizerADVANTEST CORP·Filed 1988·Granted Oct 31, 1989·11 cites·5 claims
- 1344US4769798ASuccessive period-to-voltage converting apparatusADVANTEST CORP·Filed 1988·Granted Sep 6, 1988·9 cites·22 claims
- 1442US5757221AAnalog arithmetic circuitADVANTEST CORP·Filed 1996·Granted May 26, 1998·9 cites·8 claims
- 1541US4523288AInterval-expanding timerTAKEDA RIKEN IND CO LTD·Filed 1982·Granted Jun 11, 1985·6 cites·17 claims
- 1640US7332914B2Conductor inspection apparatus and conductor inspection methodOHT INC·Filed 2004·Granted Feb 19, 2008·1 cites·8 claims
- 1739US4267436AInterval-expanding timer compensated for drift and nonlinearityHAYASHI MISHIO·Filed 1978·Granted May 12, 1981·6 cites·16 claims
- 1836US5319614ATime interval measuring apparatusADVANTEST CORP·Filed 1993·Granted Jun 7, 1994·5 cites·7 claims
- 1934US5150390AHigh-rate pulse pattern generatorADVANTEST CORP·Filed 1991·Granted Sep 22, 1992·6 cites·12 claims
- 2034US2007073512A1Conductior position inspection apparatus and conductor position inspection methodYAMAOKA SHUJI·Filed 2004·Application pending·0 cites
- 2134US2001028256A1Diagnostic apparatus for electronics circuit and diagnostic method using sameFiled 2000·Application pending·0 cites
- 2232US5239546AData multiplexing deviceADVANTEST CORP·Filed 1990·Granted Aug 24, 1993·3 cites·8 claims
- 2326US5325049AFrequency deviation measuring apparatusADVANTEST CORP·Filed 1993·Granted Jun 28, 1994·5 cites·6 claims
Join the waitlist — get patent alerts
Get an alert when Mishio Hayashi files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →