Inventor · disambiguated record
Michael Kuchel
Also filed as: KUCHEL MICHAEL · KUECHEL MICHAEL
23 granted patents·682 citations·filing 1988–2009
97Inventor score
Top patents by PatentIndex Score
23 records- 0195US4872755AInterferometer for measuring optical phase differencesZEISS STIFTUNG·Filed 1988·Granted Oct 10, 1989·127 cites·16 claims
- 0290US6879402B2Scanning interferometer for aspheric surfaces and wavefrontsZYGO CORP·Filed 2002·Granted Apr 12, 2005·53 cites·26 claims
- 0388US6717680B1Apparatus and method for phase-shifting interferometryZYGO CORP·Filed 2002·Granted Apr 6, 2004·39 cites·57 claims
- 0487US7948638B2Scanning interferometric methods and apparatus for measuring aspheric surfaces and wavefrontsZYGO CORP·Filed 2009·Granted May 24, 2011·12 cites·20 claims
- 0585US5135308AMethod and apparatus for non-contact measuring of object surfacesZEISS STIFTUNG·Filed 1991·Granted Aug 4, 1992·80 cites·18 claims
- 0684US6781700B2Scanning interferometer for aspheric surfaces and wavefrontsFiled 2002·Granted Aug 24, 2004·34 cites·50 claims
- 0783US6714308B2Rapid in-situ mastering of an aspheric fizeauZYGO CORP·Filed 2002·Granted Mar 30, 2004·26 cites·15 claims
- 0882US7612893B2Scanning interferometric methods and apparatus for measuring aspheric surfaces and wavefrontsZYGO CORP·Filed 2007·Granted Nov 3, 2009·11 cites·25 claims
- 0982US7289224B2Low coherence grazing incidence interferometry for profiling and tilt sensingZYGO CORP·Filed 2004·Granted Oct 30, 2007·16 cites·46 claims
- 1081US5361312AMethod and apparatus for phase evaluation of pattern images used in optical measurementZEISS STIFTUNG·Filed 1993·Granted Nov 1, 1994·44 cites·10 claims
- 1181US5135309AMethod and apparatus for non-contact measuring of object surfacesZEISS STIFTUNG·Filed 1991·Granted Aug 4, 1992·69 cites·11 claims
- 1280US6972849B2Scanning interferometer for aspheric surfaces and wavefrontsKUECHEL MICHAEL·Filed 2002·Granted Dec 6, 2005·31 cites·24 claims
- 1378US7218403B2Scanning interferometer for aspheric surfaces and wavefrontsZYGO CORP·Filed 2005·Granted May 15, 2007·9 cites·27 claims
- 1473US7889356B2Two grating lateral shearing wavefront sensorZYGO CORP·Filed 2009·Granted Feb 15, 2011·6 cites·41 claims
- 1569US5357341AMethod for evaluating interferograms and interferometer thereforZEISS STIFTUNG·Filed 1992·Granted Oct 18, 1994·29 cites·26 claims
- 1664US6717679B2Dispersive null-optics for aspheric surface and wavefront metrologyZYGO CORP·Filed 2002·Granted Apr 6, 2004·12 cites·36 claims
- 1763US5343294AMethod for analyzing periodic brightness patternsZEISS STIFTUNG·Filed 1992·Granted Aug 30, 1994·30 cites·16 claims
- 1862US5054912AOptical distance-measuring deviceZEISS STIFTUNG·Filed 1990·Granted Oct 8, 1991·32 cites·13 claims
- 1961US6734979B2Rapid in situ mastering of an aspheric Fizeau with residual error compensationZYGO CORP·Filed 2002·Granted May 11, 2004·8 cites·13 claims
- 2057US6816267B2Apparatus and method for calibrating an interferometer using a selectively rotatable sphereZYGO CORP·Filed 2002·Granted Nov 9, 2004·8 cites·9 claims
- 2145US6943896B2Reconfigurable interferometer systemZYGO CORP·Filed 2004·Granted Sep 13, 2005·2 cites·25 claims
- 2232US5106194AMethod and apparatus for absolute interferometric testing of plane surfacesZEISS STIFTUNG·Filed 1991·Granted Apr 21, 1992·3 cites·14 claims
- 2329US5042041ARadiation source for partially coherent radiationZEISS STIFTUNG·Filed 1990·Granted Aug 20, 1991·1 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →