Inventor · disambiguated record
Micah Ledoux
Also filed as: LEDOUX MICAH
3 granted patents·3 citations·filing 2020–2022
54Inventor score
Files withFEI CO3
Top patents by PatentIndex Score
3 records- 0188US11069509B1Method and system for backside planar view lamella preparationFEI CO·Filed 2020·Granted Jul 20, 2021·3 cites·20 claims
- 0264US12040196B2Perimeter trench formation and delineation etch delayeringFEI CO·Filed 2022·Granted Jul 16, 2024·0 cites·20 claims
- 0359US11257683B2Perimeter trench formation and delineation etch delayeringFEI CO·Filed 2020·Granted Feb 22, 2022·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →