Inventor · disambiguated record
Mike Littau
Also filed as: LITTAU MIKE
2 granted patents·6 citations·filing 2006–2010
54Inventor score
Files withNANOMETRICS INC2
Top patents by PatentIndex Score
2 records- 0170US7656542B2Method for evaluating microstructures on a workpiece based on the orientation of a grating on the workpieceNANOMETRICS INC·Filed 2006·Granted Feb 2, 2010·3 cites·27 claims
- 0269US8027037B2Method for evaluating microstructures on a workpiece based on the orientation of a grating on the workpieceNANOMETRICS INC·Filed 2010·Granted Sep 27, 2011·3 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →