Inventor · disambiguated record
Michio Niwano
Also filed as: NIWANO MICHIO
2 granted patents·1 pending application·55 citations·filing 1999–2001
65Inventor score
Files withADVANTEST CORP2
Top patents by PatentIndex Score
3 records- 0168US6508990B1Substrate treating method and apparatusADVANTEST CORP·Filed 1999·Granted Jan 21, 2003·36 cites·19 claims
- 0253US6476393B1Surface state monitoring method and apparatusADVANTEST CORP·Filed 1999·Granted Nov 5, 2002·19 cites·57 claims
- 0338US2004056196A1Method and apparatus for monitoring environment and apparatus for producing semiconductorFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →