Inventor · disambiguated record
Mineo Nomoto
Also filed as: NOMOTO MINEO
31 granted patents·5 pending applications·911 citations·filing 1981–2012
98Inventor score
Files withHITACHI LTD24NAKATA TOSHIHIKO4HITACHI DISPLAYS LTD2HITACHI KENKI FINE TECH CO LTD1HITACHI VIA MECHANICS LTD1
Top patents by PatentIndex Score
36 records- 0196US6943086B2Laser annealing apparatus, TFT device and annealing method of the sameHITACHI LTD·Filed 2002·Granted Sep 13, 2005·82 cites·32 claims
- 0296US4391511ALight exposure device and methodHITACHI LTD·Filed 1981·Granted Jul 5, 1983·153 cites·23 claims
- 0394US7119908B2Method and apparatus for measuring thickness of thin film and device manufacturing method using sameHITACHI LTD·Filed 2002·Granted Oct 10, 2006·62 cites·11 claims
- 0489US7326623B2Method of manufacturing display deviceHITACHI LTD·Filed 2005·Granted Feb 5, 2008·11 cites·17 claims
- 0589US7020306B2Polishing pad surface condition evaluation method and an apparatus thereof and a method of producing a semiconductor deviceHITACHI LTD·Filed 2001·Granted Mar 28, 2006·35 cites·11 claims
- 0689US4628531APattern checking apparatusHITACHI LTD·Filed 1984·Granted Dec 9, 1986·100 cites·9 claims
- 0788US7834353B2Method of manufacturing display deviceHITACHI DISPLAYS LTD·Filed 2008·Granted Nov 16, 2010·9 cites·4 claims
- 0887US6950545B1Nondestructive inspection method and apparatusHITACHI LTD·Filed 2000·Granted Sep 27, 2005·30 cites·33 claims
- 0985US4744047APattern test apparatus including a plurality of pattern generatorsHITACHI LTD·Filed 1985·Granted May 10, 1988·49 cites·6 claims
- 1084US7129124B2Display device, process of fabricating same, and apparatus for fabricating sameHITACHI DISPLAYS LTD·Filed 2003·Granted Oct 31, 2006·26 cites·6 claims
- 1181US7215807B2Nondestructive inspection method and apparatusHITACHI LTD·Filed 2005·Granted May 8, 2007·7 cites·10 claims
- 1279US7498589B2Scanning probe microscopeHITACHI KENKI FINE TECH CO LTD·Filed 2005·Granted Mar 3, 2009·8 cites·10 claims
- 1376US7272253B2Method for non-destructive inspection, apparatus thereof and digital camera systemHITACHI LTD·Filed 2002·Granted Sep 18, 2007·15 cites·8 claims
- 1475US8629985B2Displacement measurement method and apparatus thereof, stage apparatus, and probe microscopeNAKATA TOSHIHIKO·Filed 2012·Granted Jan 14, 2014·3 cites·18 claims
- 1575US4420233AProjecting apparatusHITACHI LTD·Filed 1982·Granted Dec 13, 1983·26 cites·16 claims
- 1674US7612889B2Method and apparatus for measuring displacement of a sampleHITACHI LTD·Filed 2005·Granted Nov 3, 2009·6 cites·9 claims
- 1774US4776023APattern inspection methodHITACHI LTD·Filed 1986·Granted Oct 4, 1988·53 cites·3 claims
- 1873US5645351ATemperature measuring method using thermal expansion and an apparatus for carrying out the sameHITACHI LTD·Filed 1994·Granted Jul 8, 1997·34 cites·32 claims
- 1973US4872187AX-ray tomographic imaging system and methodHITACHI LTD·Filed 1988·Granted Oct 3, 1989·33 cites·14 claims
- 2070US6897079B2Method of detecting and measuring endpoint of polishing processing and its apparatus and method of manufacturing semiconductor device using the sameHITACHI LTD·Filed 2001·Granted May 24, 2005·11 cites·12 claims
- 2170US5015097AMethod for inspecting filled state of via-holes filled with fillers and apparatus for carrying out the methodHITACHI LTD·Filed 1989·Granted May 14, 1991·28 cites·18 claims
- 2269US7057744B2Method and apparatus for measuring thickness of thin film and device manufacturing method using sameHITACHI LTD·Filed 2002·Granted Jun 6, 2006·13 cites·24 claims
- 2365US5301248AMethod for pattern inspection and apparatus thereforHITACHI LTD·Filed 1992·Granted Apr 5, 1994·40 cites·39 claims
- 2463US6987874B2Method and apparatus for managing surface image of thin film device, and method and apparatus for manufacturing thin film device using the sameHITACHI LTD·Filed 2002·Granted Jan 17, 2006·10 cites·19 claims
- 2562US8284406B2Displacement measurement method and apparatus thereof, stage apparatus, and probe microscopeNAKATA TOSHIHIKO·Filed 2006·Granted Oct 9, 2012·3 cites·18 claims
- 2659US6072899AMethod and device of inspecting three-dimensional shape defectHITACHI LTD·Filed 1998·Granted Jun 6, 2000·32 cites·20 claims
- 2759US5973777AMethod and apparatus for inspecting defects of surface shapeHITACHI LTD·Filed 1997·Granted Oct 26, 1999·21 cites·38 claims
- 2856US8659761B2Method and apparatus for measuring displacement of a sample using a wire grid polarizer to generate interference lightNAKATA TOSHIHIKO·Filed 2011·Granted Feb 25, 2014·0 cites·9 claims
- 2956US6794206B2Method of polishing a filmHITACHI LTD·Filed 2002·Granted Sep 21, 2004·5 cites·9 claims
- 3051US2007041410A1Apparatus for fabricating a display deviceHONGO MIKIO·Filed 2006·Application pending·0 cites
- 3149US7336816B2Method and apparatus for measuring shape of bumpsHITACHI VIA MECHANICS LTD·Filed 2004·Granted Feb 26, 2008·6 cites·21 claims
- 3248US8064066B2Method and apparatus for measuring displacement of a sample to be inspected using an interference lightNAKATA TOSHIHIKO·Filed 2009·Granted Nov 22, 2011·0 cites·14 claims
- 3348US2008145517A1Method for manufacturing plasma display panel, and apparatus for inspecting plasma display panelSASAZAWA HIDEAKI·Filed 2007·Application pending·0 cites
- 3444US2006102608A1Laser processing machine and laser processing methodKATSUTA DAISUKE·Filed 2005·Application pending·0 cites
- 3540US2004186740A1Method of trading informationFiled 2003·Application pending·0 cites
- 3636US2002163649A1Film thickness measuring method and apparatus, and thin film device manufacturing method and manufacturing apparatus using sameHITACHI LTD·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →