Inventor · disambiguated record
Michael Stelzl
Also filed as: STELZL MICHAEL
4 granted patents·2 pending applications·10 citations·filing 2005–2014
64Inventor score
Top patents by PatentIndex Score
6 records- 0180US9157869B2Method and device for detecting cracks in semiconductor substratesORTNER ANDREAS·Filed 2010·Granted Oct 13, 2015·9 cites·20 claims
- 0261US9546967B2Apparatus and method for identifying defects within the volume of a transparent sheet and use of the apparatusSCHOTT AG·Filed 2014·Granted Jan 17, 2017·1 cites·20 claims
- 0349US7521670B2Standard for referencing luminescence signalsSCHOTT AG·Filed 2006·Granted Apr 21, 2009·0 cites·11 claims
- 0444US2006202118A1Standard for referencing luminescence signalsENGEL AXEL·Filed 2005·Application pending·0 cites
- 0541US8233697B2Method and device for generating digital still pictures of wafer-shaped elements during a production processSTELZL MICHAEL·Filed 2009·Granted Jul 31, 2012·0 cites·22 claims
- 0627US2008144006A1Method for Measuring Topographic Structures on DevicesSCHOTT AG·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →