Inventor · disambiguated record
Mitsuo Suga
Also filed as: SUGA MITSUO
10 granted patents·3 pending applications·89 citations·filing 1991–2020
89Inventor score
Top patents by PatentIndex Score
13 records- 0188US6586952B2Method of inspecting pattern and inspecting instrumentFiled 2001·Granted Jul 1, 2003·28 cites·8 claims
- 0286US7928380B2Sample holder, method for observation and inspection, and apparatus for observation and inspectionJEOL LTD·Filed 2008·Granted Apr 19, 2011·9 cites·25 claims
- 0384US8030622B2Specimen holder, specimen inspection apparatus, and specimen inspection methodJEOL LTD·Filed 2009·Granted Oct 4, 2011·9 cites·19 claims
- 0484US7906760B2Inspection method and reagent solutionJEOL LTD·Filed 2008·Granted Mar 15, 2011·8 cites·11 claims
- 0580US7202476B2Charged-particle beam instrumentJEOL LTD·Filed 2006·Granted Apr 10, 2007·10 cites·26 claims
- 0667US6924482B2Method of inspecting pattern and inspecting instrumentHITACHI LTD·Filed 2003·Granted Aug 2, 2005·5 cites·10 claims
- 0759US7876113B2Method of inspecting pattern and inspecting instrumentHITACHI LTD·Filed 2008·Granted Jan 25, 2011·0 cites·14 claims
- 0856US5250506ASuperconductive switching element with semiconductor channelHITACHI LTD·Filed 1991·Granted Oct 5, 1993·14 cites·13 claims
- 0952US2010019146A1Specimen Holder, Specimen Inspection Apparatus, and Specimen Inspection MethodJEOL LTD·Filed 2009·Application pending·0 cites
- 1044US11854201B2Biological tissue image processing system, and machine learning methodNIKON CORP·Filed 2020·Granted Dec 26, 2023·0 cites·7 claims
- 1143US5550389ASuperconducting deviceHITACHI LTD·Filed 1993·Granted Aug 27, 1996·6 cites·5 claims
- 1239US2011284745A1Sample Holder, Inspection Apparatus, and Inspection MethodNISHIYAMA HIDETOSHI·Filed 2011·Application pending·0 cites
- 1337US2010243888A1Apparatus and Method for Inspecting SamplesJEOL LTD·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →