Inventor · disambiguated record
Michael Tanguay
Also filed as: TANGUAY MICHAEL · TANGUAY MICHAEL J
10 granted patents·1 pending application·128 citations·filing 2000–2015
90Inventor score
Top patents by PatentIndex Score
11 records- 0191US8357913B2Method and apparatus for sample extraction and handlingFEI CO·Filed 2007·Granted Jan 22, 2013·17 cites·15 claims
- 0290US7601976B2Dual beam systemFEI CO·Filed 2006·Granted Oct 13, 2009·10 cites·22 claims
- 0390US7511282B2Sample preparationFEI CO·Filed 2006·Granted Mar 31, 2009·36 cites·15 claims
- 0488US7161159B2Dual beam systemFEI CO·Filed 2004·Granted Jan 9, 2007·22 cites·3 claims
- 0584US8013311B2Dual beam systemFEI CO·Filed 2009·Granted Sep 6, 2011·5 cites·9 claims
- 0679US9349570B2Method and apparatus for sample extraction and handlingFEI CO·Filed 2015·Granted May 24, 2016·2 cites·12 claims
- 0776US6661009B1Apparatus for tilting a beam systemFEI CO·Filed 2002·Granted Dec 9, 2003·14 cites·23 claims
- 0875US6508883B1Throughput enhancement for single wafer reactorADVANCED TECH MATERIALS·Filed 2000·Granted Jan 21, 2003·20 cites·30 claims
- 0974US8399864B2Dual beam systemHILL RAYMOND·Filed 2011·Granted Mar 19, 2013·2 cites·7 claims
- 1056US8993962B2Method and apparatus for sample extraction and handlingFEI CO·Filed 2013·Granted Mar 31, 2015·0 cites·20 claims
- 1135US2002170673A1System and method of processing composite substrates within a high throughput reactorFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →