Inventor · disambiguated record
Motoki Imamura
Also filed as: IMAMURA MOTOKI
15 granted patents·1 pending application·128 citations·filing 2000–2013
91Inventor score
Top patents by PatentIndex Score
16 records- 0192US6678041B2Optical characteristic measuring apparatus, the method thereof and recording mediumADVANTEST CORP·Filed 2001·Granted Jan 13, 2004·83 cites·9 claims
- 0282US8493057B2Electromagnetic wave measuring apparatus, measuring method, program, and recording mediumNISHINA SHIGEKI·Filed 2010·Granted Jul 23, 2013·5 cites·10 claims
- 0382US8183528B2Electromagnetic wave measuring apparatus, measurement method, a program, and a recording mediumKATO EIJI·Filed 2009·Granted May 22, 2012·8 cites·10 claims
- 0469US8210035B2Collection medium and collection amount measuring apparatus, and measuring method, program, and recording medium of the sameIMAMURA MOTOKI·Filed 2009·Granted Jul 3, 2012·5 cites·24 claims
- 0566US8279438B2Optical measuring apparatusYAMASHITA TOMOYU·Filed 2009·Granted Oct 2, 2012·2 cites·9 claims
- 0665US8481938B2Electromagnetic wave measuring apparatus, measuring method, program, and recording mediumNISHINA SHIGEKI·Filed 2010·Granted Jul 9, 2013·1 cites·12 claims
- 0759US2011097649A1Carrier and adhesion amount measuring apparatus, and measuring method, program, and recording medium of the sameADVANTEST CORP·Filed 2009·Application pending·0 cites
- 0858US6654104B2Apparatus and method for measuring optical characteristics and recording mediumADVANTEST CORP·Filed 2001·Granted Nov 25, 2003·8 cites·4 claims
- 0957US9176008B2Electromagnetic wave measuring apparatus, measuring method, program, and recording mediumADVANTEST CORP·Filed 2013·Granted Nov 3, 2015·0 cites·11 claims
- 1057US6493074B1Method and apparatus for measuring an optical transfer characteristicADVANTEST CORP·Filed 2000·Granted Dec 10, 2002·8 cites·12 claims
- 1154US8053733B2Electromagnetic wave measuring apparatusADVANTEST CORP·Filed 2009·Granted Nov 8, 2011·0 cites·14 claims
- 1253US8969807B2Carrier and adhesion amount measuring apparatus, and measuring method, program, and recording medium of the sameIMAMURA MOTOKI·Filed 2012·Granted Mar 3, 2015·0 cites·18 claims
- 1350US6433865B1Apparatus and method for measuring optical characteristics and recording mediumADVANTEST CORP·Filed 2001·Granted Aug 13, 2002·5 cites·5 claims
- 1445US6444163B1Heat shielding apparatus for vertical continuous annealing furnaceKAWASAKI STEEL CO·Filed 2001·Granted Sep 3, 2002·1 cites·18 claims
- 1544US6519028B2Optical characteristic measuring apparatus, the method thereof and recording mediumADVANTEST CORP·Filed 2001·Granted Feb 11, 2003·2 cites·21 claims
- 1635US7006207B2Polarization mode dispersion measuring device, method, recording mediumADVANTEST CORP·Filed 2002·Granted Feb 28, 2006·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →