Inventor · disambiguated record
Moritz Andreas Meyer
Also filed as: MEYER MORITZ · MEYER MORITZ-ANDREAS
11 granted patents·2 pending applications·47 citations·filing 2003–2022
86Inventor score
Files withADVANCED MICRO DEVICES INC3GLOBALFOUNDRIES INC3MEYER MORITZ ANDREAS3LEHR MATTHIAS2RWTH AACHEN2
Top patents by PatentIndex Score
13 records- 0186US9281252B1Method comprising applying an external mechanical stress to a semiconductor structure and semiconductor processing toolGLOBALFOUNDRIES INC·Filed 2014·Granted Mar 8, 2016·17 cites·24 claims
- 0286US8329577B2Method of forming an alloy in an interconnect structure to increase electromigration resistanceLEHR MATTHIAS·Filed 2011·Granted Dec 11, 2012·8 cites·9 claims
- 0380US7335880B2Technique for CD measurement on the basis of area fraction determinationADVANCED MICRO DEVICES INC·Filed 2005·Granted Feb 26, 2008·8 cites·11 claims
- 0465US6953755B2Technique for monitoring the state of metal lines in microstructuresADVANCED MICRO DEVICES INC·Filed 2003·Granted Oct 11, 2005·6 cites·47 claims
- 0563US7718447B2System and method for estimating the crystallinity of stacked metal lines in microstructuresADVANCED MICRO DEVICES INC·Filed 2006·Granted May 18, 2010·3 cites·21 claims
- 0658US12319900B2Integral gas-introduction and stirring unit for gas-liquid reactorsRWTH AACHEN·Filed 2021·Granted Jun 3, 2025·0 cites·15 claims
- 0751US2024316859A1Method of additive manufacture of porous gas-permeable shaped bodies having controllable porosityRWTH AACHEN·Filed 2022·Application pending·0 cites
- 0849US8039395B2Technique for forming embedded metal lines having increased resistance against stress-induced material transportGLOBALFOUNDRIES INC·Filed 2004·Granted Oct 18, 2011·5 cites·27 claims
- 0949US2009197408A1Increasing electromigration resistance in an interconnect structure of a semiconductor device by forming an alloyLEHR MATTHIAS·Filed 2008·Application pending·0 cites
- 1047US8058731B2Technique for forming metal lines in a semiconductor by adapting the temperature dependence of the line resistanceMEYER MORITZ ANDREAS·Filed 2007·Granted Nov 15, 2011·0 cites·13 claims
- 1146US8575029B2Technique for forming metal lines in a semiconductor by adapting the temperature dependence of the line resistanceMEYER MORITZ ANDREAS·Filed 2011·Granted Nov 5, 2013·0 cites·20 claims
- 1243US8058081B2Method of testing an integrity of a material layer in a semiconductor structureMEYER MORITZ ANDREAS·Filed 2007·Granted Nov 15, 2011·0 cites·18 claims
- 1336US9898572B2Metal line layout based on line shiftingGLOBALFOUNDRIES INC·Filed 2016·Granted Feb 20, 2018·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →