Inventor · disambiguated record
Mohamed Saib
Also filed as: SAIB MOHAMED · SAÏB Mohamed
6 granted patents·4 citations·filing 2015–2022
69Inventor score
Top patents by PatentIndex Score
6 records- 0173US10295912B2Method for determining the parameters of an IC manufacturing process modelASELTA NANOGRAPHICS·Filed 2015·Granted May 21, 2019·2 cites·15 claims
- 0265US10578978B2Method for determining the dose corrections to be applied to an IC manufacturing process by a matching procedureASELTA NANOGRAPHICS·Filed 2016·Granted Mar 3, 2020·1 cites·16 claims
- 0365US10156796B2Method for determining the parameters of an IC manufacturing process by a differential procedureASELTA NANOGRAPHICS·Filed 2015·Granted Dec 18, 2018·1 cites·23 claims
- 0458US12278086B2Pattern height metrology using an e-beam systemIMEC VZW·Filed 2022·Granted Apr 15, 2025·0 cites·20 claims
- 0538US10522328B2Method of performing dose modulation, in particular for electron beam lithographyASELTA NANOGRAPHICS·Filed 2016·Granted Dec 31, 2019·0 cites·16 claims
- 0638US10423074B2Method for calculating the metrics of an IC manufacturing processCOMMISSARIAT ENERGIE ATOMIQUE·Filed 2015·Granted Sep 24, 2019·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →