Inventor · disambiguated record
Moon-Hyun Yoo
Also filed as: YOO MOON-HYUN
17 granted patents·5 pending applications·178 citations·filing 2001–2015
92Inventor score
Top patents by PatentIndex Score
22 records- 0195US7844940B2Mask set for microarray, method of fabricating mask set, and method of fabricating microarray using mask setSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Nov 30, 2010·48 cites·18 claims
- 0291US9594268B2Apparatus for manufacturing display device and method for manufacturing display device using the sameSAMSUNG DISPLAY CO LTD·Filed 2015·Granted Mar 14, 2017·6 cites·20 claims
- 0390US6567964B2Continuously variable dummy pattern density generating systems, methods and computer program products for patterning integrated circuitsSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted May 20, 2003·79 cites·30 claims
- 0477US7159202B2Methods, apparatus and computer program products for generating selective netlists that include interconnection influences at pre-layout and post-layout design stagesSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jan 2, 2007·26 cites·10 claims
- 0573US7536671B2Mask for forming fine pattern and method of forming the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted May 19, 2009·5 cites·26 claims
- 0670US7610574B2Method and apparatus for designing fine patternSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Oct 27, 2009·3 cites·19 claims
- 0766US7343215B2Methothology for estimating statistical distribution characteristics of product parametersSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Mar 11, 2008·4 cites·35 claims
- 0863US8045787B2System for analyzing mask topography and method of forming image using the systemSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Oct 25, 2011·2 cites·14 claims
- 0962US7913207B2Method and apparatus for verifying logic circuitSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Mar 22, 2011·0 cites·18 claims
- 1061US7617065B2Methodology for estimating statistical distribution characteristics of physical parameters of semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Nov 10, 2009·2 cites·20 claims
- 1150US8234595B2Method of designing a mask layoutKIM YOUNG-ILE·Filed 2009·Granted Jul 31, 2012·1 cites·9 claims
- 1249US7361435B2Method of creating a layout of a set of masksSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Apr 22, 2008·0 cites·12 claims
- 1346US2007094622A1Methods, Apparatus and Computer Program Products for Generating Selective Netlists that Include Interconnection Influences at Pre-Layout and Post-Layout Design StagesSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 1445US7100125B2Aggressor classification method for analyzing crosstalk of circuitSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Aug 29, 2006·1 cites·12 claims
- 1544US7097949B2Phase edge phase shift mask enforcing a width of a field gate image and fabrication method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Aug 29, 2006·1 cites·11 claims
- 1642US7506284B2Event driven switch level simulation method and simulatorSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Mar 17, 2009·0 cites·16 claims
- 1742US6998199B2Mask for manufacturing a highly-integrated circuit deviceSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Feb 14, 2006·0 cites·9 claims
- 1842US2008052660A1Method of correcting a designed pattern of a maskSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 1938US2008076047A1Method of forming image contour for predicting semiconductor device patternSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 2037US2008193863A1Mask set for microarray, method of fabricating mask set, and method of fabricating microarray using mask setSHIN JAE-PIL·Filed 2008·Application pending·0 cites
- 2135US8526707B2Method of inspecting a maskOH YOONNA·Filed 2010·Granted Sep 3, 2013·0 cites·4 claims
- 2235US2007174802A1Method of adjusting pattern densitySHIN JAE-PIL·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →