Inventor · disambiguated record
Muneki Hamashima
Also filed as: HAMASHIMA MUNEKI
42 granted patents·8 pending applications·1,226 citations·filing 1985–2018
98Inventor score
Top patents by PatentIndex Score
50 records- 0199US7109483B2Method for inspecting substrate, substrate inspecting system and electron beam apparatusEBARA CORP·Filed 2001·Granted Sep 19, 2006·159 cites·9 claims
- 0298USRE41665EObject observation apparatus and object observationNIPPON KOGAKU KK·Filed 2007·Granted Sep 14, 2010·57 cites·17 claims
- 0398US7601972B2Inspection system by charged particle beam and method of manufacturing devices using the systemEBARA CORP·Filed 2007·Granted Oct 13, 2009·49 cites·8 claims
- 0498US6593152B2Electron beam apparatus and method of manufacturing semiconductor device using the apparatusEBARA CORP·Filed 2001·Granted Jul 15, 2003·109 cites·60 claims
- 0597US7297949B2Inspection system by charged particle beam and method of manufacturing devices using the systemEBARA CORP·Filed 2006·Granted Nov 20, 2007·28 cites·6 claims
- 0697US7244932B2Electron beam apparatus and device fabrication method using the electron beam apparatusEBARA CORP·Filed 2001·Granted Jul 17, 2007·74 cites·51 claims
- 0797US7135676B2Inspection system by charged particle beam and method of manufacturing devices using the systemEBARA CORP·Filed 2001·Granted Nov 14, 2006·61 cites·12 claims
- 0896US7439502B2Electron beam apparatus and device production method using the electron beam apparatusEBARA CORP·Filed 2007·Granted Oct 21, 2008·23 cites·7 claims
- 0996USRE40221EObject observation apparatus and object observationNIPPON KOGAKU KK·Filed 2004·Granted Apr 8, 2008·58 cites·24 claims
- 1096US6479819B1Object observation apparatus and object observationNIKON CORP·Filed 2000·Granted Nov 12, 2002·69 cites·6 claims
- 1194US7095022B2Electron beam apparatus and method of manufacturing semiconductor device using the apparatusNIKON CORP·Filed 2001·Granted Aug 22, 2006·48 cites·13 claims
- 1294US6184526B1Apparatus and method for inspecting predetermined region on surface of specimen using electron beamNIKON CORP·Filed 1999·Granted Feb 6, 2001·120 cites·32 claims
- 1391US7129485B2Electron beam apparatus and method of manufacturing semiconductor device using the apparatusEBARA CORP·Filed 2004·Granted Oct 31, 2006·30 cites·8 claims
- 1490US9860516B2Image processing apparatus, image processing method and recording mediumNIPPON KOGAKU KK·Filed 2013·Granted Jan 2, 2018·10 cites·21 claims
- 1590US7247848B2Electron beam apparatus and method of manufacturing semiconductor device using the apparatusEBARA CORP·Filed 2003·Granted Jul 24, 2007·28 cites·16 claims
- 1690US6365897B1Electron beam type inspection device and method of making sameNIKON CORP·Filed 1998·Granted Apr 2, 2002·66 cites·20 claims
- 1790US4744663APattern position detection apparatus using laser beamNIPPON KOGAKU KK·Filed 1985·Granted May 17, 1988·58 cites·7 claims
- 1888US7888642B2Electron beam apparatus and method of manufacturing semiconductor device using the apparatusEBARA CORP·Filed 2008·Granted Feb 15, 2011·9 cites·9 claims
- 1987US7423267B2Electron beam apparatus and method of manufacturing semiconductor device using the apparatusEBARA CORP·Filed 2006·Granted Sep 9, 2008·8 cites·5 claims
- 2083US9706186B2Imaging apparatus for generating parallax image dataNIKON CORP·Filed 2015·Granted Jul 11, 2017·5 cites·12 claims
- 2178US7745784B2Electron beam apparatus and method of manufacturing semiconductor device using the apparatusEBARA CORP·Filed 2007·Granted Jun 29, 2010·4 cites·8 claims
- 2277US7598471B2Method of electric discharge machining a cathode for an electron gunEBARA CORP·Filed 2007·Granted Oct 6, 2009·3 cites·11 claims
- 2375US9693036B2Imaging apparatus, image processing device, computer-readable medium having stored thereon an imaging apparatus controlling program, and computer-readable medium having stored thereon an image processing programNIKON CORP·Filed 2015·Granted Jun 27, 2017·2 cites·31 claims
- 2474US6011262AObject observing apparatus and method for adjusting the sameNIKON CORP·Filed 1998·Granted Jan 4, 2000·27 cites·9 claims
- 2572US9532033B2Image sensor and imaging deviceSHIBAZAKI KIYOSHIGE·Filed 2011·Granted Dec 27, 2016·1 cites·42 claims
- 2672US6670602B1Scanning device and scanning methodNIKON CORP·Filed 1999·Granted Dec 30, 2003·21 cites·11 claims
- 2770US7205559B2Electron beam apparatus and device manufacturing method using sameEBARA CORP·Filed 2003·Granted Apr 17, 2007·14 cites·9 claims
- 2867US4769551APattern detecting apparatus utilizing energy beamNIPPON KOGAKU KK·Filed 1987·Granted Sep 6, 1988·22 cites·12 claims
- 2965US5479537AImage processing method and apparatusNIKON CORP·Filed 1992·Granted Dec 26, 1995·48 cites·18 claims
- 3061US2008121804A1Method for inspecting substrate, substrate inspecting system and electronEBARA CORP·Filed 2007·Application pending·0 cites
- 3160US2008173815A1Electron beam apparatus and device production method using the electron beam apparatusEBARA CORP·Filed 2008·Application pending·0 cites
- 3259US9906770B2Image sensor, image-capturing apparatus and image capturing systemNIKON CORP·Filed 2014·Granted Feb 27, 2018·0 cites·14 claims
- 3358US10412358B2Image sensor, image-capturing apparatus and image-capturing systemNIKON CORP·Filed 2018·Granted Sep 10, 2019·0 cites·10 claims
- 3456US2007045536A1Method for inspecting substrate, substrate inspecting system and electron beam apparatusEBARA CORP·Filed 2006·Application pending·0 cites
- 3554US9838665B2Image processing device, imaging device, and image processing programNIPPON KOGAKU KK·Filed 2014·Granted Dec 5, 2017·0 cites·14 claims
- 3652US9888226B2Image capturing device and program to control image capturing deviceNIPPON KOGAKU KK·Filed 2013·Granted Feb 6, 2018·0 cites·17 claims
- 3752US9414046B2Image sensor, imaging device and image processing deviceNIKON CORP·Filed 2014·Granted Aug 9, 2016·0 cites·9 claims
- 3851US9706190B2Image processing apparatus and image processing programNIKON CORP·Filed 2013·Granted Jul 11, 2017·0 cites·13 claims
- 3951US6953944B2Scanning device and method including electric charge movementNIKON CORP·Filed 2003·Granted Oct 11, 2005·1 cites·21 claims
- 4049US10027942B2Imaging processing apparatus, image-capturing apparatus, and storage medium having image processing program stored thereonNIKON CORP·Filed 2014·Granted Jul 17, 2018·0 cites·9 claims
- 4149US2014307060A1Image sensorNIKON CORP·Filed 2014·Application pending·0 cites
- 4249US2014340488A1Image capturing apparatusNIKON CORP·Filed 2014·Application pending·0 cites
- 4348US10429402B2Washing/drying apparatus, screening apparatus, washing/drying method, and screening methodNIKON CORP·Filed 2014·Granted Oct 1, 2019·0 cites·19 claims
- 4448US9854224B2Image processing apparatus, image capturing apparatus, and image processing programMORI SUSUMU·Filed 2012·Granted Dec 26, 2017·0 cites·16 claims
- 4548US9727985B2Image processing apparatus, image-capturing apparatus, and storage medium having image processing program stored thereonNIKON CORP·Filed 2014·Granted Aug 8, 2017·0 cites·26 claims
- 4643US2014027653A1Optical element, optical device, measurement device, and screening apparatusNIKON CORP·Filed 2013·Application pending·0 cites
- 4743US2016059201A1Biochip fixing method, biochip fixing device, and screening method for biomolecule arrayNIKON CORP·Filed 2014·Application pending·0 cites
- 4841US5373567AMethod and apparatus for pattern matchingNIKON CORP·Filed 1993·Granted Dec 13, 1994·14 cites·19 claims
- 4934US9341935B2Image capturing deviceHAMASHIMA MUNEKI·Filed 2011·Granted May 17, 2016·0 cites·9 claims
- 5033US2016144368A1Plate, method for manufacturing plate, method for observing biochip, and method for screeningNIKON CORP·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →