Inventor · disambiguated record
Mukul Kelkar
Also filed as: KELKAR MUKUL
10 granted patents·3 pending applications·612 citations·filing 1996–2019
91Inventor score
Top patents by PatentIndex Score
13 records- 0197US6039834AApparatus and methods for upgraded substrate processing system with microwave plasma sourceAPPLIED MATERIALS INC·Filed 1997·Granted Mar 21, 2000·242 cites·25 claims
- 0296US6079426AMethod and apparatus for determining the endpoint in a plasma cleaning processAPPLIED MATERIALS INC·Filed 1997·Granted Jun 27, 2000·132 cites·29 claims
- 0393US6361707B1Apparatus and methods for upgraded substrate processing system with microwave plasma sourceAPPLIED MATERIALS INC·Filed 2000·Granted Mar 26, 2002·39 cites·26 claims
- 0492US6230652B1Apparatus and methods for upgraded substrate processing system with microwave plasma sourceAPPLIED MATERIALS INC·Filed 2000·Granted May 15, 2001·43 cites·6 claims
- 0591US6045618AMicrowave apparatus for in-situ vacuum line cleaning for substrate processing equipmentAPPLIED MATERIALS INC·Filed 1996·Granted Apr 4, 2000·130 cites·21 claims
- 0672US11011268B2System and method for managing medical waste received in one or more containersARK TECH LLC·Filed 2019·Granted May 18, 2021·2 cites·9 claims
- 0770US6958658B2Circuit and method for generating a clock signalINTEL CORP·Filed 2003·Granted Oct 25, 2005·15 cites·17 claims
- 0864US7479777B2Circuitry and method to measure a duty cycle of a clock signalINTEL CORP·Filed 2006·Granted Jan 20, 2009·5 cites·20 claims
- 0956US2014156449A1Method and apparatus for item recommendationEMBL RETAIL INC·Filed 2013·Application pending·0 cites
- 1043US6960950B2Circuit and method for generating a clock signalINTEL CORP·Filed 2003·Granted Nov 1, 2005·4 cites·26 claims
- 1143US2019131013A1Pharmaceutical waste sorting assistance system and method thereofKELKAR MUKUL·Filed 2018·Application pending·0 cites
- 1236US2018300791A1Method and system for recommending fitting footwearEMBL RETAIL INC·Filed 2016·Application pending·0 cites
- 1326US7705620B2Measuring and identifying analog characteristics of a microelectronic component at a wafer level and a platform levelINTEL CORP·Filed 2006·Granted Apr 27, 2010·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →