Inventor · disambiguated record
Murong Lang
Also filed as: Lang Murong
79 granted patents·34 pending applications·98 citations·filing 2016–2025
98Inventor score
Top patents by PatentIndex Score
113 records- 0197US11495316B1Optimized seasoning trim values based on form factors in memory sub-system manufacturingMICRON TECHNOLOGY INC·Filed 2021·Granted Nov 8, 2022·6 cites·20 claims
- 0296US9852800B2Adaptive determination of program parameter using program of erase rateSANDISK TECHNOLOGIES INC·Filed 2016·Granted Dec 26, 2017·28 cites·19 claims
- 0395US11244740B1Adapting an error recovery process in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2020·Granted Feb 8, 2022·5 cites·20 claims
- 0494US11901014B2Partial block handling in a non-volatile memory deviceMICRON TECHNOLOGY INC·Filed 2022·Granted Feb 13, 2024·4 cites·20 claims
- 0593US12050777B2Adaptive scanning of memory devices with supervised learningMICRON TECHNOLOGY INC·Filed 2022·Granted Jul 30, 2024·2 cites·20 claims
- 0693US12026394B2Adaptive time sense parameters and overdrive voltage parameters for wordlines at corner temperatures in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2022·Granted Jul 2, 2024·2 cites·20 claims
- 0793US12014049B2Adaptive sensing time for memory operationsMICRON TECHNOLOGY INC·Filed 2022·Granted Jun 18, 2024·2 cites·20 claims
- 0893US10790036B1Adjustment of read and write voltages using a space between threshold voltage distributionsMICRON TECHNOLOGY INC·Filed 2019·Granted Sep 29, 2020·12 cites·20 claims
- 0992US11881284B2Open translation unit management using an adaptive read thresholdMICRON TECHNOLOGY INC·Filed 2021·Granted Jan 23, 2024·2 cites·20 claims
- 1092US11854644B2Performing select gate integrity checks to identify and invalidate defective blocksMICRON TECHNOLOGY INC·Filed 2021·Granted Dec 26, 2023·2 cites·17 claims
- 1192US10910069B2Manage source line bias to account for non-uniform resistance of memory cell source linesSANDISK TECHNOLOGIES LLC·Filed 2020·Granted Feb 2, 2021·3 cites·20 claims
- 1291US12013792B2Error avoidance for partially programmed blocks of a memory deviceMICRON TECHNOLOGY INC·Filed 2022·Granted Jun 18, 2024·2 cites·20 claims
- 1391US11861178B2Managing a hybrid error recovery process in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2021·Granted Jan 2, 2024·2 cites·20 claims
- 1491US11740959B2Dynamic voltage setting optimization during lifetime of a memory deviceMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 29, 2023·3 cites·20 claims
- 1590US10908845B1Managing threshold voltage drift based on a temperature-dependent slope of the threshold voltage drift of a memory sub-systemMICRON TECHNOLOGY INC·Filed 2019·Granted Feb 2, 2021·8 cites·20 claims
- 1689US11966591B2Apparatus with read level management and methods for operating the sameMICRON TECHNOLOGY INC·Filed 2022·Granted Apr 23, 2024·1 cites·20 claims
- 1788US12431215B2Dynamic read calibrationMICRON TECHNOLOGY INC·Filed 2023·Granted Sep 30, 2025·1 cites·20 claims
- 1888US12014050B2Adaptive time sense parameters and overdrive voltage parameters for respective groups of wordlines in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2022·Granted Jun 18, 2024·1 cites·20 claims
- 1988US11526295B2Managing an adjustable write-to-read delay of a memory sub-systemMICRON TECHNOLOGY INC·Filed 2020·Granted Dec 13, 2022·2 cites·20 claims
- 2087US12073905B2Adaptive error avoidance in the memory devicesMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 27, 2024·1 cites·20 claims
- 2187US11960745B2Empty page scan operations adjustmentMICRON TECHNOLOGY INC·Filed 2022·Granted Apr 16, 2024·1 cites·20 claims
- 2283US11763914B2Adapting an error recovery process in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2021·Granted Sep 19, 2023·1 cites·20 claims
- 2383US2025356928A1Apparatus with read level management and methods for operating the sameMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 2480US11742029B2Adjusting read-level thresholds based on write-to-write delayMICRON TECHNOLOGY INC·Filed 2021·Granted Aug 29, 2023·1 cites·20 claims
- 2580US2025342891A1Low stress refresh erase in a memory deviceMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 2679US12417026B2Adaptive sensing time for memory operationsMICRON TECHNOLOGY INC·Filed 2024·Granted Sep 16, 2025·0 cites·20 claims
- 2779US10726925B2Manage source line bias to account for non-uniform resistance of memory cell source linesSANDISK TECHNOLOGIES LLC·Filed 2018·Granted Jul 28, 2020·2 cites·25 claims
- 2878US12379864B2Empty page scan operations adjustmentMICRON TECHNOLOGY INC·Filed 2024·Granted Aug 5, 2025·0 cites·20 claims
- 2978US12272418B2Performing select gate integrity checks to identify and invalidate defective blocksMICRON TECHNOLOGY INC·Filed 2023·Granted Apr 8, 2025·0 cites·20 claims
- 3078US11127481B1Managing execution of scrub operations in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2020·Granted Sep 21, 2021·1 cites·20 claims
- 3178US2025299755A1Managing an adaptive data path selection threshold for a memory sub-systemMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 3277US12242755B2Adaptive enhanced corrective read based on write and read temperatureMICRON TECHNOLOGY INC·Filed 2024·Granted Mar 4, 2025·0 cites·20 claims
- 3377US2025321679A1Modification of program voltage level with read or program-verify adjustment for improving reliability in memory devicesMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 3476US12176060B2Open translation unit management using an adaptive read thresholdMICRON TECHNOLOGY INC·Filed 2023·Granted Dec 24, 2024·0 cites·20 claims
- 3575US12481426B2Optimizing data reliability using erase retentionMICRON TECHNOLOGY INC·Filed 2023·Granted Nov 25, 2025·0 cites·20 claims
- 3675US12451189B2Partial block handling protocol in a non-volatile memory deviceMICRON TECHNOLOGY INC·Filed 2024·Granted Oct 21, 2025·0 cites·20 claims
- 3775US12386515B2Modification of program voltage level with read or program-verify adjustment for improving reliability in memory devicesMICRON TECHNOLOGY INC·Filed 2024·Granted Aug 12, 2025·0 cites·20 claims
- 3875US12217794B2Managing the programming of an open translation unitMICRON TECHNOLOGY INC·Filed 2024·Granted Feb 4, 2025·0 cites·20 claims
- 3975US12210752B2Managing a hybrid error recovery process in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2023·Granted Jan 28, 2025·0 cites·20 claims
- 4075US2025210125A1Performing select gate integrity checks to identify and invalidate defective blocksMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 4174US2025061928A1Open translation unit management using an adaptive read thresholdMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 4274US2025036307A1Cross-temperature mitigation in a memory systemMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 4373US2024231644A1Apparatus with time-based read level management and methods for operating the sameMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 4473US2025118364A1Managing the programming of an open translation unitMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 4572US12475058B2Error avoidance for partially programmed blocks of a memory deviceMICRON TECHNOLOGY INC·Filed 2024·Granted Nov 18, 2025·0 cites·18 claims
- 4672US2024321350A1Refresh of neighboring memory cells based on read statusMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 4772US2025104772A1Memory cell voltage level selectionMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 4871US12511080B1Block family management for a virtual blockMICRON TECHNOLOGY INC·Filed 2024·Granted Dec 30, 2025·0 cites·20 claims
- 4971US12260916B2Partial block handling in a non-volatile memory deviceMICRON TECHNOLOGY INC·Filed 2024·Granted Mar 25, 2025·0 cites·20 claims
- 5071US11914889B2Managing an adjustable write-to-read delay based on cycle counts in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2022·Granted Feb 27, 2024·0 cites·20 claims
Showing the top 50 of 113 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →