Inventor · disambiguated record
Muneaki Tamura
Also filed as: TAMURA MUNEAKI
4 granted patents·1 pending application·4 citations·filing 2005–2019
58Inventor score
Top patents by PatentIndex Score
5 records- 0183US11221363B2Test device, test method, and memory mediumTOKYO ELECTRON LTD·Filed 2018·Granted Jan 11, 2022·4 cites·16 claims
- 0242US11340263B2Probe device and method of adjusting the sameTOKYO ELECTRON LTD·Filed 2019·Granted May 24, 2022·0 cites·7 claims
- 0337US2008024794A1Semiconductor Surface Inspection Apparatus and Method of IlluminationMIYAZAKI YOKO·Filed 2005·Application pending·0 cites
- 0433US10006941B2Position accuracy inspecting method, position accuracy inspecting apparatus, and position inspecting unitTOKYO ELECTRON LTD·Filed 2015·Granted Jun 26, 2018·0 cites·13 claims
- 0530US10310010B2Probe apparatus and probe methodTOKYO ELECTRON LTD·Filed 2015·Granted Jun 4, 2019·0 cites·5 claims
Join the waitlist — get patent alerts
Get an alert when Muneaki Tamura files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →