Inventor · disambiguated record
Mu-Chun Wang
Also filed as: WANG MU-CHUN
22 granted patents·6 pending applications·326 citations·filing 1997–2004
95Inventor score
Top patents by PatentIndex Score
28 records- 0187US6242763B1Low triggering voltage SOI silicon-control-rectifier (SCR) structureUNITED MICROELECTRONICS CORP·Filed 1999·Granted Jun 5, 2001·74 cites·26 claims
- 0283US6483045B1Via plug layout structure for connecting different metallic layersUNITED MICROELECTRONICS CORP·Filed 2000·Granted Nov 19, 2002·40 cites·12 claims
- 0383US6448599B1Semiconductor device for preventing process-induced charging damagesUNITED MICROELECTRONICS CORP·Filed 2000·Granted Sep 10, 2002·35 cites·24 claims
- 0471US6291281B1Method of fabricating protection structureUNITED MICROELECTRONICS CORP·Filed 1999·Granted Sep 18, 2001·32 cites·15 claims
- 0569US6873505B2Electrostatic discharge protective circuitry equipped with a common discharge lineUNITED MICROELECTRONICS CORP·Filed 2001·Granted Mar 29, 2005·15 cites·13 claims
- 0668US5959311AStructure of an antenna effect monitorUNITED MICROELECTRONICS CORP·Filed 1998·Granted Sep 28, 1999·34 cites·10 claims
- 0767US6583641B2Method of determining integrity of a gate dielectricUNITED MICROELECTRONICS CORP·Filed 2001·Granted Jun 24, 2003·16 cites·15 claims
- 0866US6455910B1Cross guard-ring structure to protect the chip crack in low dielectric constant and copper processUNITED MICROELECTRONIC CORP·Filed 2001·Granted Sep 24, 2002·14 cites·11 claims
- 0963US7217980B2CMOS silicon-control-rectifier (SCR) structure for electrostatic discharge (ESD) protectionUNITED MICROELECTRONICS CORP·Filed 2004·Granted May 15, 2007·9 cites·18 claims
- 1063US6235642B1Method for reducing plasma charging damagesUNITED MICROELECTRONICS CORP·Filed 2000·Granted May 22, 2001·11 cites·22 claims
- 1146US6060347AMethod for preventing damage to gate oxide from well in complementary metal-oxide semiconductorUNITED MICROELECTRONICS CORP·Filed 1998·Granted May 9, 2000·13 cites·16 claims
- 1244US6878581B1Electrostatic discharge protection structure and a method for forming the sameUNITED MICROELECTRONICS CORP·Filed 2001·Granted Apr 12, 2005·2 cites·18 claims
- 1338US6291285B1Method for protecting gate oxide layer and monitoring damageUNITED MICROELECTRONICS CORP·Filed 1998·Granted Sep 18, 2001·5 cites·9 claims
- 1437US6110841AMethod for avoiding plasma damageUNITED MICROELECTRONICS CORP·Filed 1999·Granted Aug 29, 2000·6 cites·14 claims
- 1537US2004207020A1CMOS silicon-control-rectifier (SCR) structure for electrostatic discharge (ESD) protectionFiled 2001·Application pending·0 cites
- 1635US2002100979A1Semiconductor structure for measuring dielectric constant and clarifying polarization effect of interlevel dielectric layerFiled 2001·Application pending·0 cites
- 1735US2002167071A1Guard ring for protecting integrated circuitsFiled 2001·Application pending·0 cites
- 1835US2002061640A1Method of manufacturing passivation layerUNITED MICROELECTRONICS CORP N·Filed 2000·Application pending·0 cites
- 1934US6191602B1Wafer acceptance testing method and structure of a test key used in the methodUNITED MICROELECTRONICS CORP·Filed 1998·Granted Feb 20, 2001·5 cites·20 claims
- 2034US2003155933A1Dielectric test structure and test methodFiled 2002·Application pending·0 cites
- 2133US6269315B1Reliability testing method of dielectric thin filmUNITED MICROELECTRONICS CORP·Filed 1999·Granted Jul 31, 2001·5 cites·12 claims
- 2231US6289291B1Statistical method of monitoring gate oxide layer yieldUNITED MICROELECTRONICS CORP·Filed 1998·Granted Sep 11, 2001·2 cites·4 claims
- 2331US6274494B1Method of protecting gate oxideUNITED MICROELECTRONICS CORP·Filed 1998·Granted Aug 14, 2001·1 cites·16 claims
- 2431US6229347B1Circuit for evaluating an asysmetric antenna effectUNITED MICROELECTRONICS CORP·Filed 1999·Granted May 8, 2001·1 cites·15 claims
- 2531US6051986AMethod of testing a transistorUNITED MICROELECTRONICS CORP·Filed 1997·Granted Apr 18, 2000·2 cites·7 claims
- 2630US6245610B1Method of protecting a well at a floating stageUNITED MICROELECTRONICS CORP·Filed 1999·Granted Jun 12, 2001·1 cites·14 claims
- 2728US6159864AMethod of preventing damages of gate oxides of a semiconductor wafer in a plasma-related processUNITED MICROELECTRONICS CORP·Filed 1999·Granted Dec 12, 2000·3 cites·6 claims
- 2828US2001044191A1Method for manufacturing semiconductor deviceFiled 1999·Application pending·0 cites
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