Inventor · disambiguated record
Myung-Jo Chun
Also filed as: CHUN MYUNG-JO
7 granted patents·4 pending applications·15 citations·filing 2006–2017
77Inventor score
Top patents by PatentIndex Score
11 records- 0178US7659573B2Semiconductor device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Feb 9, 2010·6 cites·5 claims
- 0264US8053342B2Mask ROM device, semiconductor device including the mask ROM device, and methods of fabricating mask ROM device and semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2010·Granted Nov 8, 2011·1 cites·7 claims
- 0363US8111553B2Non-volatile semiconductor memory device in which program disturb is reduced and method of programming the sameSEO BO-YOUNG·Filed 2010·Granted Feb 7, 2012·3 cites·10 claims
- 0462US7733696B2Non-volatile memory devices including local control gates on multiple isolated well regions and related methods and systemsSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jun 8, 2010·5 cites·10 claims
- 0555US7777256B2Mask ROM device, semiconductor device including the mask ROM device, and methods of fabricating mask ROM device and semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Aug 17, 2010·0 cites·13 claims
- 0653US7638387B2Mask ROM and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Dec 29, 2009·0 cites·20 claims
- 0752US2010059888A1Mask ROM and method of fabricating the sameLEE YONG-KYU·Filed 2009·Application pending·0 cites
- 0847US2008179692A1Mask rom devices and methods for forming the sameCHUN MYUNG-JO·Filed 2008·Application pending·0 cites
- 0940US2008093646A1Non-volatile memory device and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 1039US10522430B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Dec 31, 2019·0 cites·20 claims
- 1139US2010167487A1Mask rom devices and methods for forming the sameCHUN MYUNG-JO·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →