US2010059888A1PendingUtilityA1
Mask ROM and method of fabricating the same
Est. expiryMar 7, 2026(expired)· nominal 20-yr term from priority
H10B 20/10H10B 99/00H10B 20/00
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Claims
Abstract
A mask read-only memory (ROM) includes a dielectric layer formed on a substrate and a plurality of first conductive lines formed on the dielectric layer. A plurality of diodes are formed in the first conductive lines, and a plurality of final vias are formed for a first set of the diodes each representing a first type of memory cell, with no final via being formed for a second set of diodes each representing a second type of memory cell. Each of a plurality of second conductive lines is formed over a column of the diodes.
Claims
exact text as granted — not AI-modified1 . A mask read-only memory (ROM) comprising:
a dielectric layer formed on a substrate; a plurality of first conductive lines formed on the dielectric layer; a plurality of diodes formed in the first conductive lines; a plurality of final vias formed for a first set of the diodes each representing a first type of memory cell, wherein no final via is formed for a second set of diodes each representing a second type of memory cell; and a plurality of second conductive lines, each formed over a column of the diodes.
2 . The mask ROM of claim 1 , wherein the final vias are formed under a top-most interconnect layer.
3 . The mask ROM of claim 2 , wherein the second conductive lines are formed as the top-most interconnect layer.
4 . The mask ROM of claim 1 , wherein the second conductive lines used as bit-lines are formed perpendicular to the first conductive lines used as word lines with each of the diodes being formed at an intersection of the first and second conductive lines.
5 . The mask ROM of claim 1 , wherein each final via couples a respective one of the diodes to a respective one of the second conductive lines.
6 . The mask ROM of claim 1 , wherein the dielectric layer covers an integrated circuit formed on the semiconductor substrate.
7 . The mask ROM of claim 1 , wherein the first conductive lines are comprised of polysilicon having an n-type dopant, and wherein the diodes are formed by forming p-type regions in the first conductive lines.
8 . The mask ROM of claim 1 , further comprising:
a plurality of contacts, each disposed between a respective one of the diodes and a respective one of the final vias.
9 . The mask ROM of claim 1 , further comprising:
a passivation layer disposed on the second conductive lines.
10 . The mask ROM of claim 1 , further comprising:
a plurality of strapping lines, each coupled to a respective one of the first conductive lines.Cited by (0)
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