Inventor · disambiguated record
Myoung-Sub Kim
Also filed as: KIM MYOUNG SUB
27 granted patents·4 pending applications·162 citations·filing 2000–2024
95Inventor score
Top patents by PatentIndex Score
31 records- 0195US8934294B2Semiconductor integrated circuit device, method of manufacturing the same, and method of driving the sameSK HYNIX INC·Filed 2014·Granted Jan 13, 2015·22 cites·16 claims
- 0292US8693241B2Semiconductor intergrated circuit device, method of manufacturing the same, and method of driving the sameKIM MYOUNG SUB·Filed 2011·Granted Apr 8, 2014·26 cites·27 claims
- 0390US10861503B1Electronic deviceSK HYNIX INC·Filed 2019·Granted Dec 8, 2020·5 cites·16 claims
- 0487US9842882B1Electronic deviceSK HYNIX INC·Filed 2017·Granted Dec 12, 2017·6 cites·19 claims
- 0585US10373679B1Electronic device and method for reading data of resistive memory cell including drift recoverySK HYNIX INC·Filed 2017·Granted Aug 6, 2019·7 cites·21 claims
- 0684US12295273B2Electronic device and method for manufacturing electronic deviceSK HYNIX INC·Filed 2024·Granted May 6, 2025·0 cites·17 claims
- 0784US9984748B1Electronic device and method for reading data stored in resistive memory cellSK HYNIX INC·Filed 2017·Granted May 29, 2018·4 cites·13 claims
- 0883US9111762B2Semiconductor device and method for manufacturing the sameSK HYNIX INC·Filed 2013·Granted Aug 18, 2015·5 cites·16 claims
- 0983US6541290B1Architecture of laser fuse box of semiconductor integrated circuit and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Apr 1, 2003·34 cites·13 claims
- 1080US10283197B1Electronic device and method for reading data of memory cellSK HYNIX INC·Filed 2017·Granted May 7, 2019·5 cites·5 claims
- 1180US9818481B2Resistive memory device and operation method thereofSK HYNIX INC·Filed 2017·Granted Nov 14, 2017·4 cites·4 claims
- 1279US9613690B2Resistive memory device and operation method thereofSK HYNIX INC·Filed 2013·Granted Apr 4, 2017·5 cites·13 claims
- 1379US8416616B2Phase change memory device and method for manufacturing the sameCHANG HEON YONG·Filed 2011·Granted Apr 9, 2013·4 cites·19 claims
- 1477US11950522B2Electronic device and method for manufacturing electronic deviceSK HYNIX INC·Filed 2022·Granted Apr 2, 2024·0 cites·7 claims
- 1576US8917545B2Semiconductor intergrated circuit device, method of manufacturing the same, and method of driving the sameSK HYNIX INC·Filed 2014·Granted Dec 23, 2014·4 cites·1 claims
- 1676US6682959B2Architecture of laser fuse box of semiconductor integrated circuit and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jan 27, 2004·22 cites·15 claims
- 1773US10547001B2Electronic device and method for fabricating the sameSK HYNIX INC·Filed 2018·Granted Jan 28, 2020·2 cites·7 claims
- 1873US10090029B2Electronic device for suppressing read disturbance and method of driving the sameSK HYNIX INC·Filed 2017·Granted Oct 2, 2018·3 cites·20 claims
- 1967US11430952B2Electronic device and method for manufacturing electronic deviceSK HYNIX INC·Filed 2020·Granted Aug 30, 2022·0 cites·16 claims
- 2067US10056138B1Electronic deviceSK HYNIX INC·Filed 2017·Granted Aug 21, 2018·2 cites·20 claims
- 2166US11170824B2Electronic deviceSK HYNIX INC·Filed 2020·Granted Nov 9, 2021·0 cites·14 claims
- 2263US9236121B2Semiconductor memory apparatus and temperature control method thereofSK HYNIX INC·Filed 2014·Granted Jan 12, 2016·2 cites·19 claims
- 2362US11283017B2Electronic device and operating method of electronic deviceSK HYNIX INC·Filed 2020·Granted Mar 22, 2022·0 cites·19 claims
- 2451US11450360B2Resistive memory device for lowering resistance value of memory cell during set program operationSK HYNIX INC·Filed 2020·Granted Sep 20, 2022·0 cites·15 claims
- 2551US2009039333A1Phase change memory device and method for manufacturing the sameCHANG HEON YONG·Filed 2008·Application pending·0 cites
- 2650US2014166965A1Resistive memory device and fabrication method thereofSK HYNIX INC·Filed 2013·Application pending·0 cites
- 2747US9054304B2Resistive memory device capable of preventing disturbance and method for manufacturing the sameSK HYNIX INC·Filed 2013·Granted Jun 9, 2015·0 cites·11 claims
- 2846US2009153171A1Apparatus for testing objects under controlled conditionsLEE SANG-SIK·Filed 2008·Application pending·0 cites
- 2941US10878904B2Resistive memory device and method for minimizing time for set program operationSK HYNIX INC·Filed 2019·Granted Dec 29, 2020·0 cites·18 claims
- 3040US9437295B2Semiconductor system including semiconductor memory apparatus and temperature control method thereofSK HYNIX INC·Filed 2015·Granted Sep 6, 2016·0 cites·20 claims
- 3139US2008164898A1Probe card for test of semiconductor chips and method for test of semiconductor chips using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →