Inventor · disambiguated record
Naoki Hosoya
Also filed as: HOSOYA NAOKI
17 granted patents·6 pending applications·147 citations·filing 1987–2022
93Inventor score
Top patents by PatentIndex Score
23 records- 0185US8853628B2Defect inspection method, and device thereofHOSOYA NAOKI·Filed 2011·Granted Oct 7, 2014·8 cites·10 claims
- 0284US9390490B2Method and device for testing defect using SEMTAKAGI YUJI·Filed 2010·Granted Jul 12, 2016·7 cites·5 claims
- 0382US9311697B2Inspection method and device thereforHARADA MINORU·Filed 2011·Granted Apr 12, 2016·6 cites·17 claims
- 0480US6792366B2Method and apparatus for inspecting defects in a semiconductor waferHITACHI LTD·Filed 2001·Granted Sep 14, 2004·21 cites·10 claims
- 0577US6792367B2Method and apparatus for inspecting defects in a semiconductor waferHITACHI LTD·Filed 2002·Granted Sep 14, 2004·18 cites·2 claims
- 0673US6870169B2Method and apparatus for analyzing composition of defectsHITACHI LTD·Filed 2003·Granted Mar 22, 2005·18 cites·23 claims
- 0771US6029635AFuel vapor emission preventing systemFUJI HEAVY IND LTD·Filed 1998·Granted Feb 29, 2000·49 cites·18 claims
- 0868US8121395B2Inspection apparatus and an inspection method for inspecting a circuit patternHIROI TAKASHI·Filed 2009·Granted Feb 21, 2012·3 cites·4 claims
- 0967US8730318B2Inspection apparatus and method for producing image for inspectionNAKAHIRA KENJI·Filed 2011·Granted May 20, 2014·1 cites·8 claims
- 1065US9291604B2Method for measurement of vibration property of structure, and vibration property measurement deviceKAJIWARA ITSURO·Filed 2011·Granted Mar 22, 2016·3 cites·2 claims
- 1165US9057873B2Global alignment using multiple alignment pattern candidatesMIYAMOTO ATSUSHI·Filed 2011·Granted Jun 16, 2015·2 cites·7 claims
- 1265US8111902B2Method and apparatus for inspecting defects of circuit patternsHIROI TAKASHI·Filed 2006·Granted Feb 7, 2012·4 cites·12 claims
- 1360US8509516B2Circuit pattern examining apparatus and circuit pattern examining methodHIROI TAKASHI·Filed 2009·Granted Aug 13, 2013·1 cites·13 claims
- 1457US2014210988A1Inspection Apparatus and Method for Producing Image for InspectionHITACHI GE NUCLEAR ENERGY LTD·Filed 2014·Application pending·0 cites
- 1547US2022003919A1Backlight apparatusSAKAI DISPLAY PRODUCTS CORP·Filed 2018·Application pending·0 cites
- 1646US11840390B2ContainerSHARP KK·Filed 2022·Granted Dec 12, 2023·0 cites·14 claims
- 1745US12283766B2Connector and flat cableSHARP DISPLAY TECHNOLOGY CORP·Filed 2022·Granted Apr 22, 2025·0 cites·14 claims
- 1844US2011188735A1Method and device for defect inspectionHOSOYA NAOKI·Filed 2009·Application pending·0 cites
- 1940US2006078189A1Method and apparatus for inspectionHOSOYA NAOKI·Filed 2005·Application pending·0 cites
- 2039US2006078188A1Method and its apparatus for classifying defectsKURIHARA MASAKI·Filed 2005·Application pending·0 cites
- 2138US4890307AInput circuit of charge transfer deviceTOSHIBA KK·Filed 1988·Granted Dec 26, 1989·6 cites·11 claims
- 2233US2021272530A1Control device and liquid crystal display deviceSAKAI DISPLAY PRODUCTS CORP·Filed 2018·Application pending·0 cites
- 2329US4800579ACharge transfer device provided with charge detection circuit of a floating gate systemTOSHIBA KK·Filed 1987·Granted Jan 24, 1989·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →