Inventor · disambiguated record
Narjes Javaheri
Also filed as: JAVAHERI NARJES
4 granted patents·2 pending applications·2 citations·filing 2018–2024
58Inventor score
Top patents by PatentIndex Score
6 records- 0183US12105432B2Metrology method and associated computer productASML NETHERLANDS BV·Filed 2020·Granted Oct 1, 2024·2 cites·20 claims
- 0267US11448974B2Metrology parameter determination and metrology recipe selectionASML NETHERLANDS BV·Filed 2021·Granted Sep 20, 2022·0 cites·22 claims
- 0357US10990020B2Metrology parameter determination and metrology recipe selectionASML NETHERLANDS BV·Filed 2018·Granted Apr 27, 2021·0 cites·23 claims
- 0451US2025238571A1Digital twin calibrationFEI ELECTRON OPTICS B V·Filed 2024·Application pending·0 cites
- 0547US2025131552A1Metrology method and associated metrology deviceASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0640US10705437B2Metrology method and apparatus, computer program and lithographic systemASML NETHERLANDS BV·Filed 2018·Granted Jul 7, 2020·0 cites·15 claims
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