Inventor · disambiguated record
Naoki Kiryu
Also filed as: KIRYU NAOKI
18 granted patents·3 pending applications·196 citations·filing 2003–2010
94Inventor score
Top patents by PatentIndex Score
21 records- 0194US7461309B2Systems and methods for providing output data in an LBIST system having a limited number of output portsTOSHIBA KK·Filed 2005·Granted Dec 2, 2008·32 cites·19 claims
- 0289US7558996B2Systems and methods for identifying errors in LBIST testingTOSHIBA KK·Filed 2006·Granted Jul 7, 2009·18 cites·17 claims
- 0388US7484153B2Systems and methods for LBIST testing using isolatable scan chainsTOSHIBA KK·Filed 2005·Granted Jan 27, 2009·17 cites·8 claims
- 0488US7475311B2Systems and methods for diagnosing rate dependent errors using LBISTTOSHIBA KK·Filed 2005·Granted Jan 6, 2009·17 cites·17 claims
- 0587US8208325B2Semiconductor device, semiconductor package and memory repair methodURAKAWA YUKIHIRO·Filed 2010·Granted Jun 26, 2012·12 cites·20 claims
- 0683US7308634B2Systems and methods for LBIST testing using multiple functional subphasesTOSHIBA KK·Filed 2005·Granted Dec 11, 2007·12 cites·16 claims
- 0779US7266745B2Programmable scan shift speed control for LBISTTOSHIBA KK·Filed 2005·Granted Sep 4, 2007·10 cites·13 claims
- 0879US7055077B2Systems and methods for circuit testingTOSHIBA KK·Filed 2003·Granted May 30, 2006·23 cites·23 claims
- 0978US7103495B2System and method for burn-in test controlTOSHIBA KK·Filed 2004·Granted Sep 5, 2006·21 cites·8 claims
- 1077US7350124B2Method and apparatus for accelerating through-the pins LBIST simulationIBM·Filed 2005·Granted Mar 25, 2008·8 cites·6 claims
- 1171US7681098B2Systems and methods for improved fault coverage of LBIST testingTOSHIBA KK·Filed 2006·Granted Mar 16, 2010·6 cites·9 claims
- 1270US7631237B2Multi-test method for using compare MISRTOSHIBA KK·Filed 2005·Granted Dec 8, 2009·6 cites·18 claims
- 1362US7627798B2Systems and methods for circuit testing using LBISTTOSHIBA KK·Filed 2004·Granted Dec 1, 2009·10 cites·13 claims
- 1452US7797600B2Method and apparatus for testing a ring of non-scan latches with logic built-in self-testIBM·Filed 2008·Granted Sep 14, 2010·1 cites·14 claims
- 1552US7406640B2Method and apparatus for testing a ring of non-scan latches with logic built-in self-testIBM·Filed 2006·Granted Jul 29, 2008·1 cites·6 claims
- 1650US7478304B2Apparatus for accelerating through-the-pins LBIST simulationIBM·Filed 2007·Granted Jan 13, 2009·0 cites·12 claims
- 1742US7080298B2Circuit apparatus and method for testing integrated circuits using weighted pseudo-random test patternsIBM·Filed 2003·Granted Jul 18, 2006·2 cites·11 claims
- 1841US2007188186A1Systems and methods for managing power supplied to integrated circuitsTOSHIBA AMERICA ELECTRONIC·Filed 2006·Application pending·0 cites
- 1936US2007011537A1Systems and methods for self-diagnosing LBISTTOSHIBA AMERICA ELECTRONIC·Filed 2005·Application pending·0 cites
- 2036US2007168809A1Systems and methods for LBIST testing using commonly controlled LBIST satellitesKIRYU NAOKI·Filed 2005·Application pending·0 cites
- 2122US8130570B2Data transfer circuitFUKUI AKIHIKO·Filed 2010·Granted Mar 6, 2012·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →