Inventor · disambiguated record
Nai-Ying Lo
Also filed as: LO NAI-YING
3 granted patents·2 pending applications·4 citations·filing 2006–2024
53Inventor score
Files withUNITED MICROELECTRONICS CORP5
Top patents by PatentIndex Score
5 records- 0175US2024176335A1Fault detection method for detecting behavior deviation of parametersUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 0269US2024004374A1Fault detection method for detecting behavior deviation of parametersUNITED MICROELECTRONICS CORP·Filed 2022·Application pending·0 cites
- 0358US7681590B2Process apparatus and transportation system thereofUNITED MICROELECTRONICS CORP·Filed 2006·Granted Mar 23, 2010·4 cites·19 claims
- 0455US11821847B2Wafer backside defect detection method and wafer backside defect detection apparatusUNITED MICROELECTRONICS CORP·Filed 2021·Granted Nov 21, 2023·0 cites·20 claims
- 0541US11644427B2Automatic detection method and automatic detection system for detecting crack on wafer edgesUNITED MICROELECTRONICS CORP·Filed 2020·Granted May 9, 2023·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →