Inventor · disambiguated record
Nader Pakdaman
Also filed as: PAKDAMAN NADER
20 granted patents·2 pending applications·973 citations·filing 2001–2014
97Inventor score
Top patents by PatentIndex Score
22 records- 0198US8344745B2Test structures for evaluating a fabrication of a die or a waferTAU METRIX INC·Filed 2006·Granted Jan 1, 2013·90 cites·16 claims
- 0298US7736916B2System and apparatus for using test structures inside of a chip during the fabrication of the chipTAU METRIX INC·Filed 2007·Granted Jun 15, 2010·97 cites·11 claims
- 0397US7256055B2System and apparatus for using test structures inside of a chip during the fabrication of the chipTAU METRIX INC·Filed 2004·Granted Aug 14, 2007·134 cites·31 claims
- 0496US6621275B2Time resolved non-invasive diagnostics systemOPTONICS INC·Filed 2001·Granted Sep 16, 2003·137 cites·25 claims
- 0595US8990759B2Contactless technique for evaluating a fabrication of a waferAGHABABAZADEH MAJID·Filed 2010·Granted Mar 24, 2015·59 cites·22 claims
- 0695US7423288B2Technique for evaluating a fabrication of a die and waferTAU METRIX INC·Filed 2007·Granted Sep 9, 2008·26 cites·40 claims
- 0794US7605597B2Intra-chip power and test signal generation for use with test structures on wafersTAU METRIX INC·Filed 2007·Granted Oct 20, 2009·18 cites·10 claims
- 0894US7220990B2Technique for evaluating a fabrication of a die and waferTAU METRIX INC·Filed 2004·Granted May 22, 2007·59 cites·59 claims
- 0993US6836131B2Spray cooling and transparent cooling plate thermal management systemCREDENCE SYSTEMS CORP·Filed 2003·Granted Dec 28, 2004·58 cites·30 claims
- 1092US6594086B1Bi-convex solid immersion lensOPTONICS INC A CREDENCE COMPAN·Filed 2002·Granted Jul 15, 2003·71 cites·19 claims
- 1191US6859031B2Apparatus and method for dynamic diagnostic testing of integrated circuitsCREDENCE SYSTEMS CORP·Filed 2002·Granted Feb 22, 2005·79 cites·19 claims
- 1289US6778327B2Bi-convex solid immersion lensCREDENCE SYSTEMS CORP·Filed 2003·Granted Aug 17, 2004·33 cites·20 claims
- 1388US7730434B2Contactless technique for evaluating a fabrication of a waferTAU METRIX INC·Filed 2004·Granted Jun 1, 2010·24 cites·57 claims
- 1488US7492529B2Bi-convex solid immersion lensDCG SYSTEMS INC·Filed 2007·Granted Feb 17, 2009·9 cites·38 claims
- 1588US7339388B2Intra-clip power and test signal generation for use with test structures on wafersTAU METRIX INC·Filed 2004·Granted Mar 4, 2008·25 cites·26 claims
- 1686US7224828B2Time resolved non-invasive diagnostics systemCREDENCE SYSTEMS CORP·Filed 2003·Granted May 29, 2007·27 cites·20 claims
- 1785US7466852B2Time resolved non-invasive diagnostics systemDCG SYSTEMS INC·Filed 2007·Granted Dec 16, 2008·11 cites·34 claims
- 1882US7723724B2System for using test structures to evaluate a fabrication of a waferTAU METRIX INC·Filed 2008·Granted May 25, 2010·4 cites·10 claims
- 1973US8410568B2Integrated photodiode for semiconductor substratesSTEINBRUECK GARY·Filed 2009·Granted Apr 2, 2013·3 cites·12 claims
- 2071US7227702B2Bi-convex solid immersion lensCREDENCE SYSTEMS CORP·Filed 2004·Granted Jun 5, 2007·9 cites·11 claims
- 2171US2016104812A1Integrated photodiode for semiconductor substratesTAU METRIX INC·Filed 2014·Application pending·0 cites
- 2233US2006103378A1Apparatus and method for dynamic diagnostic testing of integrated circuitsPAKDAMAN NADER·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →