Inventor · disambiguated record
Nedal Saleh
Also filed as: SALEH NEDAL · SALEH NEDAL R
6 granted patents·9 pending applications·4 citations·filing 2011–2024
70Inventor score
Top patents by PatentIndex Score
15 records- 0172US8869081B2Automating integrated circuit device library generation in model based metrologyIBM·Filed 2013·Granted Oct 21, 2014·3 cites·15 claims
- 0267US10832895B2Stand alone microfluidic analytical chip devicePLASMOTICA LLC·Filed 2017·Granted Nov 10, 2020·1 cites·19 claims
- 0367US2024386996A1ARTIFICIAL INTELLIGENCE BASED SYSTEMS AND METHODS FOR ANALYZING MICRO-RIBONUCLEIC ACID (miRNA) SIGNATURE SEQUENCES AND PROFILES IN BIOLOGICAL SAMPLESCONVERGENT ANIMAL HEALTH LLC·Filed 2024·Application pending·0 cites
- 0466US12429418B2Phase-resolved optical metrology for substratesAPPLIED MATERIALS INC·Filed 2023·Granted Sep 30, 2025·0 cites·20 claims
- 0563US2024021269A1SYSTEMS AND METHODS FOR ANALYZING MICRO-RIBONUCLEIC ACID (miRNA) SIGNATURE PROFILES IN BIOTIC AND ABIOTIC SAMPLESCONVERGENT ANIMAL HEALTH LLC·Filed 2023·Application pending·0 cites
- 0652US10497541B2Apparatus and method for programmable spatially selective nanoscale surface functionalizationSALEH NEDAL·Filed 2017·Granted Dec 3, 2019·0 cites·21 claims
- 0752US2017333864A1Stand alone microfluidic analytical chip devicePLASMOTICA LLC·Filed 2017·Application pending·0 cites
- 0847US2017338080A1Apparatus and method for programmable spatially selective nanoscale surface functionalizationPLASMOTICA LLC·Filed 2017·Application pending·0 cites
- 0947US2017333898A1Self-flowing microfluidic analytical chipPLASMOTICA LLC·Filed 2017·Application pending·0 cites
- 1046US2014073114A1In-situ active wafer charge screening by conformal groundingGLOBALFOUNDRIES INC·Filed 2013·Application pending·0 cites
- 1140US2013200501A1In-situ active wafer charge screening by conformal groundingCEN CHENG·Filed 2012·Application pending·0 cites
- 1240US2016299103A1Application of electron-beam induced plasma probes to inspection, test, debug and surface modificationsPHOTON DYNAMICS INC·Filed 2014·Application pending·0 cites
- 1339US8860956B2Spectrometry employing extinction coefficient modulationIBM·Filed 2013·Granted Oct 14, 2014·0 cites·20 claims
- 1430US9091942B2Scatterometry measurement of line edge roughness in the bright fieldSALEH NEDAL R·Filed 2011·Granted Jul 28, 2015·0 cites·17 claims
- 1528US2017294291A1APPLICATION OF eBIP TO INSPECTION, TEST, DEBUG AND SURFACE MODIFICATIONSORBOTECH LTD·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →