Inventor · disambiguated record
Nir Bendavid
Also filed as: BENDAVID NIR
4 granted patents·2 pending applications·12 citations·filing 2020–2025
69Inventor score
Files withKLA CORP6
Top patents by PatentIndex Score
6 records- 0192US12001148B2Enhancing performance of overlay metrologyKLA CORP·Filed 2023·Granted Jun 4, 2024·2 cites·26 claims
- 0292US11761969B2System and method for analyzing a sample with a dynamic recipe based on iterative experimentation and feedbackKLA CORP·Filed 2020·Granted Sep 19, 2023·4 cites·25 claims
- 0392US11353799B1System and method for error reduction for metrology measurementsKLA CORP·Filed 2020·Granted Jun 7, 2022·5 cites·25 claims
- 0483US11592755B2Enhancing performance of overlay metrologyKLA CORP·Filed 2021·Granted Feb 28, 2023·1 cites·30 claims
- 0565US2025172881A1Calibrated measurement of overlay error using small targetsKLA CORP·Filed 2025·Application pending·0 cites
- 0663US2024295827A1Calibrated measurement of overlay error using small targetsKLA CORP·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →