Inventor · disambiguated record
Nicolas B. Cobb
Also filed as: COBB NICOLAS · COBB NICOLAS B · COBB NICOLAS BAILEY
33 granted patents·5 pending applications·2,222 citations·filing 1999–2017
98Inventor score
Top patents by PatentIndex Score
38 records- 0198US7367009B2Convergence technique for model-based optical and process correctionMENTOR GRAPHICS CORP·Filed 2006·Granted Apr 29, 2008·53 cites·7 claims
- 0298US7237221B2Matrix optical process correctionGRANIK YURI·Filed 2005·Granted Jun 26, 2007·80 cites·8 claims
- 0398US6415421B2Integrated verification and manufacturability toolMENTOR GRAPHICS CORP·Filed 2000·Granted Jul 2, 2002·377 cites·40 claims
- 0497US6928634B2Matrix optical process correctionFiled 2003·Granted Aug 9, 2005·94 cites·16 claims
- 0597US6430737B1Convergence technique for model-based optical and process correctionMENTOR GRAPHICS CORP·Filed 2000·Granted Aug 6, 2002·83 cites·24 claims
- 0697US6249904B1Method and apparatus for submicron IC design using edge fragment tagging to correct edge placement distortionFiled 1999·Granted Jun 19, 2001·201 cites·7 claims
- 0796US7024655B2Mixed-mode optical proximity correctionCOBB NICOLAS B·Filed 2002·Granted Apr 4, 2006·75 cites·17 claims
- 0896US6748578B2Streamlined IC mask layout optical and process correction through correction reuseFiled 2001·Granted Jun 8, 2004·70 cites·36 claims
- 0996US6467076B1Method and apparatus for submicron IC designFiled 1999·Granted Oct 15, 2002·137 cites·37 claims
- 1096US6425113B1Integrated verification and manufacturability toolFiled 2000·Granted Jul 23, 2002·142 cites·45 claims
- 1196US6301697B1Streamlined IC mask layout optical and process correction through correction reuseFiled 1999·Granted Oct 9, 2001·127 cites·27 claims
- 1295US6668367B2Selective promotion for resolution enhancement techniquesFiled 2002·Granted Dec 23, 2003·65 cites·27 claims
- 1394US7324930B2Method and apparatus for performing OPC using model curvatureCOBB NICOLAS B·Filed 2003·Granted Jan 29, 2008·52 cites·6 claims
- 1494US7240321B2Selective promotion for resolution enhancement techniquesCOBB NICOLAS B·Filed 2003·Granted Jul 3, 2007·57 cites·13 claims
- 1594US7073162B2Site control for OPCMENTOR GRAPHICS CORP·Filed 2003·Granted Jul 4, 2006·101 cites·17 claims
- 1694US6643616B1Integrated device structure prediction based on model curvatureFiled 1999·Granted Nov 4, 2003·100 cites·6 claims
- 1793US7017141B2Integrated verification and manufacturability toolANDERSON LEIGH C·Filed 2002·Granted Mar 21, 2006·87 cites·11 claims
- 1892US7155699B2Streamlined IC mask layout optical and process correction through correction reuseCOBB NICOLAS B·Filed 2004·Granted Dec 26, 2006·38 cites·4 claims
- 1992US6335128B1Method and apparatus for determining phase shifts and trim masks for an integrated circuitFiled 1999·Granted Jan 1, 2002·87 cites·26 claims
- 2091US7861207B2Fragmentation point and simulation site adjustment for resolution enhancement techniquesMENTOR GRAPHICS CORP·Filed 2005·Granted Dec 28, 2010·20 cites·29 claims
- 2191US7234130B2Long range corrections in integrated circuit layout designsWORD JAMES·Filed 2005·Granted Jun 19, 2007·31 cites·15 claims
- 2290US7926002B2Selective optical proximity layout design data correctionMENTOR GRAPHICS CORP·Filed 2008·Granted Apr 12, 2011·15 cites·20 claims
- 2389US7945871B2Integrated OPC verification toolCOBB NICOLAS B·Filed 2008·Granted May 17, 2011·11 cites·9 claims
- 2489US7434199B2Dense OPCCOBB NICOLAS BAILEY·Filed 2005·Granted Oct 7, 2008·21 cites·35 claims
- 2589US7412676B2Integrated OPC verification toolCOBB NICOLAS B·Filed 2005·Granted Aug 12, 2008·29 cites·15 claims
- 2689US7028284B2Convergence technique for model-based optical and process correctionCOBB NICOLAS BAILEY·Filed 2002·Granted Apr 11, 2006·53 cites·31 claims
- 2784US9857693B1Lithography model calibration via cache-based niching genetic algorithmsMENTOR GRAPHICS CORP·Filed 2017·Granted Jan 2, 2018·4 cites·27 claims
- 2879US8566753B2Fragmentation point and simulation site adjustment for resolution enhancement techniquesWORD JAMES·Filed 2010·Granted Oct 22, 2013·4 cites·23 claims
- 2978US9361422B2Fragmentation point and simulation site adjustment for resolution enhancement techniquesMENTOR GRAPHICS CORP·Filed 2013·Granted Jun 7, 2016·3 cites·26 claims
- 3061US6455205B1Method and apparatus for determining phase shifts and trim masks for an integrated circuitFiled 2001·Granted Sep 24, 2002·5 cites·15 claims
- 3160US10354044B2Fragmentation point and simulation site adjustment for resolution enhancement techniquesMENTOR GRAPHICS CORP·Filed 2017·Granted Jul 16, 2019·0 cites·11 claims
- 3258US9703922B2Fragmentation point and simulation site adjustment for resolution enhancement techniquesMENTOR GRAPHICS CORP·Filed 2016·Granted Jul 11, 2017·0 cites·19 claims
- 3344US2004221254A1Mixed mode optical proximity correctionMENTOR GRAPHICS CORP·Filed 2004·Application pending·0 cites
- 3442US2004083475A1Distribution of operations to remote computersMENTOR GRAPHICS CORP·Filed 2002·Application pending·0 cites
- 3542US2011191726A1Selective Optical Proximity Layout Design Data CorrectionWORD JAMES C·Filed 2011·Application pending·0 cites
- 3639US2008140989A1Multiprocessor Architecture With Hierarchical Processor OrganizationDUDAU DRAGOS·Filed 2006·Application pending·0 cites
- 3736US8533636B2Tolerable flare difference determinationKOMIRENKO SERGIY·Filed 2011·Granted Sep 10, 2013·0 cites·20 claims
- 3836US2018196349A1Lithography Model Calibration Via Genetic Algorithms with Adaptive Deterministic Crowding and Dynamic NichingMENTOR GRAPHICS CORP·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →