Inventor · disambiguated record
Nimit Endlay
Also filed as: Endlay Nimit
2 granted patents·7 citations·filing 2016–2018
54Inventor score
Files withST MICROELECTRONICS INT NV2
Top patents by PatentIndex Score
2 records- 0188US10393804B2Clock selection circuit and test clock generation circuit for LBIST and ATPG test circuitST MICROELECTRONICS INT NV·Filed 2018·Granted Aug 27, 2019·4 cites·17 claims
- 0278US10228420B2Clock selection circuit and test clock generation circuit for LBIST and ATPG test circuitST MICROELECTRONICS INT NV·Filed 2016·Granted Mar 12, 2019·3 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →