Inventor · disambiguated record
Nilanjan Ghosh
Also filed as: GHOSH NILANJAN · GHOSH NILANJAN Z
5 granted patents·2 pending applications·12 citations·filing 2013–2016
72Inventor score
Top patents by PatentIndex Score
7 records- 0181US9746428B2Inline inspection of the contact between conductive traces and substrate for hidden defects using white light interferometer with tilted objective lensINTEL CORP·Filed 2016·Granted Aug 29, 2017·3 cites·20 claims
- 0279US9389064B2Inline inspection of the contact between conductive traces and substrate for hidden defects using white light interferometer with tilted objective lensINTEL CORP·Filed 2014·Granted Jul 12, 2016·4 cites·12 claims
- 0377US9508610B2Inline measurement of molding material thickness using terahertz reflectanceINTEL CORP·Filed 2014·Granted Nov 29, 2016·5 cites·15 claims
- 0452US10078204B2Non-destructive 3-dimensional chemical imaging of photo-resist materialINTEL CORP·Filed 2014·Granted Sep 18, 2018·0 cites·36 claims
- 0536US9441952B2Metrology tool for electroless copper thickness measurement for BBUL process development monitoringGHOSH NILANJAN·Filed 2013·Granted Sep 13, 2016·0 cites·16 claims
- 0632US2017170080A1Material thickness device and methodINTEL CORP·Filed 2015·Application pending·0 cites
- 0731US2017284943A1Detecting voids and delamination in photoresist layerGHOSH NILANJAN·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →