Inventor · disambiguated record
Nickolai Isakovitch
Also filed as: ISAKOVITCH NICKOLAI
0 granted patents·6 pending applications·0 citations·filing 2023–2024
Files withKLA CORP6
Top patents by PatentIndex Score
6 records- 0177US2024337953A1System and method for tracking real-time position for scanning overlay metrologyKLA CORP·Filed 2023·Application pending·0 cites
- 0272US2024337952A1System and method for determining overlay measurement of a scanning targetKLA CORP·Filed 2023·Application pending·0 cites
- 0365US2025297955A1Scanning diffraction based overlay scatterometryKLA CORP·Filed 2024·Application pending·0 cites
- 0462US2025328087A1System and method for determining overlay measurement of a scanning target using multiple wavelengthsKLA CORP·Filed 2024·Application pending·0 cites
- 0558US2024302751A1Multi-overlay stacked grating metrology targetKLA CORP·Filed 2023·Application pending·0 cites
- 0655US2025314482A1Focus position measurement while scanningKLA CORP·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →