Inventor · disambiguated record
Niklas Mevenkamp
Also filed as: MEVENKAMP NIKLAS
2 granted patents·1 pending application·0 citations·filing 2019–2025
23Inventor score
Top patents by PatentIndex Score
3 records- 0159US12367559B2Method and apparatus for the contactless measurement of objectsZEISS CARL INDUSTRIELLE MESSTECHNIK GMBH·Filed 2024·Granted Jul 22, 2025·0 cites·12 claims
- 0255US2025216842A1Computer implemented method for defect detection in an imaging dataset of a wafer, corresponding computer-readable medium, computer program product and systems making use of such methodsZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 0343US11790510B2Material testing of optical test piecesZEISS CARL JENA GMBH·Filed 2019·Granted Oct 17, 2023·0 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →