Inventor · disambiguated record
Nimrod Smith
Also filed as: SMITH NIMROD
4 granted patents·21 pending applications·0 citations·filing 2022–2025
56Inventor score
Files withAPPLIED MATERIALS INC25
Top patents by PatentIndex Score
25 records- 0184US2025320628A1Epi isolation plate and parallel block purge flow tuning for growth rate and uniformityAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 0284US2025323027A1Process kits and related methods for processing chambers to facilitate deposition process adjustabilityAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 0380US2024254655A1Epi isolation plate and parallel block purge flow tuning for growth rate and uniformityAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 0477US2025354292A1Epi isolation plate with gap and angle adjustment for process tuningAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 0576US12456614B2Process kits and related methods for processing chambers to facilitate deposition process adjustabilityAPPLIED MATERIALS INC·Filed 2022·Granted Oct 28, 2025·0 cites·20 claims
- 0675US12354855B2Process kits and related methods for processing chambers to facilitate deposition process adjustabilityAPPLIED MATERIALS INC·Filed 2022·Granted Jul 8, 2025·0 cites·19 claims
- 0774US2025146173A1Epi isolation plate and parallel block purge flow tuning for growth rate and uniformityAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 0866US2024254654A1Epi isolation plate with gap and angle adjustment for process tuningAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 0964US2025003112A1Virtual sensor for predicting and monitoring temperature of chamber componentsAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 1063US2025129509A1Auxiliary flow plate for thickness and concentration uniformity adjustabilityAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 1160US2025003806A1Chamber kits, systems, and methods for calibrating temperature sensors for semiconductor manufacturingAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 1259US12221696B2Process kits and related methods for processing chambers to facilitate deposition process adjustabilityAPPLIED MATERIALS INC·Filed 2022·Granted Feb 11, 2025·0 cites·22 claims
- 1358US2025341019A1Envelope and isolation plate for ir transmission adjustmentAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 1458US2024247404A1Pre-heat rings and processing chambers including black quartz, and related methodsAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 1557US2025316526A1Measurement regions and substrate support assemblies for property measurementsAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 1657US2024141487A1Epi overlapping disk and ringAPPLIED MATERIALS INC·Filed 2022·Application pending·0 cites
- 1755US12455512B2Pneumatic controlled flexure system for stabilizing a projection deviceAPPLIED MATERIALS INC·Filed 2022·Granted Oct 28, 2025·0 cites·20 claims
- 1854US2024145273A1Multi-wavelength pyrometer for chamber monitoringAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 1953US2024337537A1Systems, apparatus, and methods for monitoring plate temperature for semiconductor manufacturingAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 2053US2024363327A1Epi thermal profile tuning with lamp radiation shieldsAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 2152US2024339352A1Susceptor for process chamberAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 2252US2024141551A1Dichroic mirror and shortpass filter for in-situ reflectometryAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 2351US2024274463A1Overlapping substrate supports and pre-heat rings, and related process kits, processing chambers, methods, and componentsAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 2449US2024035161A1Actively controlled pre-heat ring for process temperature controlAPPLIED MATERIALS INC·Filed 2022·Application pending·0 cites
- 2549US2024258141A1Methods and apparatus for calibration of substrate processing chamber placement via imagingAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →