Inventor · disambiguated record
Norman Chang
Also filed as: CHANG NORMAN · CHANG NORMAN H
35 granted patents·5 pending applications·605 citations·filing 1995–2025
97Inventor score
Files withANSYS INC25HEWLETT PACKARD CO5HEWLETT PACKARD DEVELOPMENT CO5APACHE DESIGN SOLUTIONS INC1HEWLETT PACKARD DEVELOPMENT LP1
Top patents by PatentIndex Score
40 records- 0194US5610833AComputer-aided design methods and apparatus for multilevel interconnect technologiesHEWLETT PACKARD CO·Filed 1995·Granted Mar 11, 1997·208 cites·10 claims
- 0293US11301608B2Layout-based side-channel emission analysisANSYS INC·Filed 2020·Granted Apr 12, 2022·4 cites·20 claims
- 0392US10592634B1Systems and methods for automatic handling of engineering design parameter violationsANSYS INC·Filed 2018·Granted Mar 17, 2020·13 cites·20 claims
- 0491US11797744B1Methods and systems for predicting silicon density for a metal layer of semi-conductor chip via machine learningANSYS INC·Filed 2021·Granted Oct 24, 2023·3 cites·12 claims
- 0591US11520960B1Register transfer level based side channel leakage assessmentANSYS INC·Filed 2021·Granted Dec 6, 2022·6 cites·20 claims
- 0689US11880456B1Adaptive leakage impact region detection and modeling for counterfeit chips detectionANSYS INC·Filed 2021·Granted Jan 23, 2024·2 cites·20 claims
- 0788US10599799B1Low-dropout regulator and charge pump modeling using frequency-domain fitting methodsANSYS INC·Filed 2017·Granted Mar 24, 2020·5 cites·14 claims
- 0886US11853661B2Systems and methods for machine learning based fast static thermal solverANSYS INC·Filed 2022·Granted Dec 26, 2023·1 cites·14 claims
- 0986US10579757B1Calculating and extracting joule-heating and self-heat induced temperature on wire segments for chip reliabilityANSYS INC·Filed 2018·Granted Mar 3, 2020·8 cites·20 claims
- 1086US10371583B1Systems and methods for estimating temperatures of wires in an integrated circuit chipANSYS INC·Filed 2015·Granted Aug 6, 2019·4 cites·23 claims
- 1185US11210444B1Timing assistant for dynamic voltage drop impact on setup/hold constraintsANSYS INC·Filed 2019·Granted Dec 28, 2021·8 cites·26 claims
- 1283US12177349B1Machine learning for automatic identification of points of interest for side channel leakageANSYS INC·Filed 2021·Granted Dec 24, 2024·1 cites·21 claims
- 1381US5946482AMethod and apparatus for using parameters to simulate an electronic circuitHEWLETT PACKARD CO·Filed 1997·Granted Aug 31, 1999·97 cites·24 claims
- 1480US11366947B2Systems and methods for machine learning based fast static thermal solverANSYS INC·Filed 2019·Granted Jun 21, 2022·2 cites·12 claims
- 1578US6018623AMethod and system for determining statistically based worst-case on-chip interconnect delay and crosstalkHEWLETT PACKARD CO·Filed 1997·Granted Jan 25, 2000·96 cites·19 claims
- 1677US12242781B2Systems and methods for machine learning based fast static thermal solverANSYS INC·Filed 2023·Granted Mar 4, 2025·0 cites·20 claims
- 1777US2025088358A1Machine learning for automatic identification of points of interest for side channel leakageANSYS INC·Filed 2024·Application pending·0 cites
- 1876US11599633B1Security information extraction and probe insertion for side-channel analysisANSYS INC·Filed 2021·Granted Mar 7, 2023·1 cites·20 claims
- 1976US6981230B1On-chip power-ground inductance modeling using effective self-loop-inductanceAPACHE DESIGN SOLUTIONS INC·Filed 2002·Granted Dec 27, 2005·26 cites·24 claims
- 2075US11914931B2Predicting on chip transient thermal response in a multi-chip system using an RNN-based predictorANSYS INC·Filed 2019·Granted Feb 27, 2024·3 cites·29 claims
- 2174US6434724B1Method for extracting inductance parameters from a circuit designHEWLETT PACKARD CO·Filed 2000·Granted Aug 13, 2002·28 cites·7 claims
- 2273US2025173487A1Systems and methods for machine learning based fast static thermal solverANSYS INC·Filed 2025·Application pending·0 cites
- 2372US12393686B2Adaptive leakage impact region detection and modeling for counterfeit chips detectionANSYS INC·Filed 2023·Granted Aug 19, 2025·0 cites·20 claims
- 2472US12307184B1Methods and systems for predicting silicon density for a metal layer of semi-conductor chip via machine learningANSYS INC·Filed 2023·Granted May 20, 2025·0 cites·17 claims
- 2572US10970437B2Calculating and extracting Joule-heating and self-heat induced temperature on wire segments for chip reliabilityANSYS INC·Filed 2020·Granted Apr 6, 2021·1 cites·20 claims
- 2668US6621305B2Partial swing low power CMOS logic circuitsHEWLETT PACKARD DEVELOPMENT CO·Filed 2001·Granted Sep 16, 2003·15 cites·17 claims
- 2767US10817631B1Low-dropout regulator and charge pump modeling using frequency-domain fitting methodsANSYS INC·Filed 2020·Granted Oct 27, 2020·0 cites·20 claims
- 2865US6566924B2Parallel push algorithm detecting constraints to minimize clock skewHEWLETT PACKARD DEVELOPMENT CO·Filed 2001·Granted May 20, 2003·14 cites·21 claims
- 2963US6567960B2System for improving circuit simulations by utilizing a simplified circuit model based on effective capacitance and inductance valuesHEWLETT PACKARD DEVELOPMENT LP·Filed 2001·Granted May 20, 2003·10 cites·20 claims
- 3059US6925555B2System and method for determining a plurality of clock delay values using an optimization algorithmHEWLETT PACKARD DEVELOPMENT CO·Filed 2001·Granted Aug 2, 2005·8 cites·23 claims
- 3156US11995187B1Systems and methods for a comprehensive and efficient simulation-based methodology on IP authentication and trojan detectionANSYS INC·Filed 2020·Granted May 28, 2024·0 cites·20 claims
- 3255US6981231B2System and method to reduce leakage power in an electronic deviceHEWLETT PACKARD DEVELOPMENT CO·Filed 2002·Granted Dec 27, 2005·5 cites·14 claims
- 3355US6412101B1Simultaneous path optimization (SPO) system and methodHEWLETT PACKARD CO·Filed 1999·Granted Jun 25, 2002·31 cites·68 claims
- 3451US6661281B2Method for reducing current surge using multi-stage ramp shuntingHEWLETT PACKARD DEVELOPMENT CO·Filed 2001·Granted Dec 9, 2003·5 cites·26 claims
- 3549US12412110B2Systems and methods for machine learning based risky circuit pattern identificationANSYS INC·Filed 2019·Granted Sep 9, 2025·0 cites·21 claims
- 3647US11973868B2Systems and methods for a fast near-field electromagnetic simulation methodology for side-channel emission analysisANSYS INC·Filed 2020·Granted Apr 30, 2024·0 cites·14 claims
- 3745US12277371B2Dynamic current modeling in dynamic voltage drop analysisANSYS INC·Filed 2020·Granted Apr 15, 2025·0 cites·20 claims
- 3841US2003212538A1Method for full-chip vectorless dynamic IR and timing impact analysis in IC designsFiled 2003·Application pending·0 cites
- 3941US2003212973A1Methods for full-chip vectorless dynamic IR analysis in IC designsFiled 2003·Application pending·0 cites
- 4039US2003084353A1System and method for predictive power rampingFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →