Inventor · disambiguated record
Nobuyuki Hama
Also filed as: HAMA NOBUYUKI
20 granted patents·245 citations·filing 1996–2018
94Inventor score
Top patents by PatentIndex Score
20 records- 0184US7998370B2Conductive paste as well as conductive coating and conductive film prepared from sameIST CORP·Filed 2007·Granted Aug 16, 2011·15 cites·10 claims
- 0281US5822518AMethod for accessing informationHITACHI LTD·Filed 1996·Granted Oct 13, 1998·76 cites·5 claims
- 0379US6874243B2Measuring instrumentMITUTOYO CORP·Filed 2004·Granted Apr 5, 2005·36 cites·6 claims
- 0478US6453418B1Method for accessing informationHITACHI LTD·Filed 2000·Granted Sep 17, 2002·29 cites·3 claims
- 0577US7373807B2Drive unitMITUTOYO CORP·Filed 2006·Granted May 20, 2008·9 cites·8 claims
- 0672US9250053B2Surface roughness measuring unit and coordinate measuring apparatusMITUTOYO CORP·Filed 2013·Granted Feb 2, 2016·3 cites·18 claims
- 0770US6728888B2Method for accessing informationHITACHI LTD·Filed 2001·Granted Apr 27, 2004·12 cites·2 claims
- 0868US6357134B1Height gaugeMITUTOYO CORP·Filed 2000·Granted Mar 19, 2002·16 cites·6 claims
- 0967US10584981B2Surface texture measuring apparatusMITUTOYO CORP·Filed 2018·Granted Mar 10, 2020·1 cites·6 claims
- 1061US9891033B2Tilt angle adjuster for form measuring deviceMITUTOYO CORP·Filed 2016·Granted Feb 13, 2018·1 cites·14 claims
- 1157US8276435B2Surface texture measuring instrument and measuring methodKANEMATSU TOSHIHIRO·Filed 2009·Granted Oct 2, 2012·3 cites·3 claims
- 1255US6092203AMethod for accessing informationHITACHI LTD·Filed 1998·Granted Jul 18, 2000·20 cites·8 claims
- 1352US10001358B2Measuring probe and measuring probe systemMITUTOYO CORP·Filed 2016·Granted Jun 19, 2018·0 cites·10 claims
- 1452US9103656B2Method for cleaning skid of surface roughness testerMATSUMIYA SADAYUKI·Filed 2011·Granted Aug 11, 2015·0 cites·2 claims
- 1550US6240518B1Method for accessing informationHITACHI LTD·Filed 1999·Granted May 29, 2001·16 cites·12 claims
- 1641US10704605B2Rotation transmitterMITUTOYO CORP·Filed 2017·Granted Jul 7, 2020·0 cites·2 claims
- 1739USD686095SDigital display device for surface-roughness measuring instrumentsMATSUMIYA SADAYUKI·Filed 2012·Granted Jul 16, 2013·3 cites·1 claims
- 1839USD614053SSurface-roughness measurement instrumentMITUTOYO CORP·Filed 2009·Granted Apr 20, 2010·4 cites·1 claims
- 1933US6466884B2Surface texture measuring machine and method of correcting a measured value for the machineMITUTOYO CORP·Filed 2001·Granted Oct 15, 2002·0 cites·10 claims
- 2032USD686096SDigital display device for surface-roughness measuring instrumentsMATSUMIYA SADAYUKI·Filed 2012·Granted Jul 16, 2013·1 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →