Inventor · disambiguated record
Nobufusa Iwanishi
Also filed as: IWANISHI NOBUFUSA
15 granted patents·5 pending applications·306 citations·filing 1995–2011
94Inventor score
Top patents by PatentIndex Score
20 records- 0182US6396307B1Semiconductor integrated circuit and method for designing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted May 28, 2002·23 cites·5 claims
- 0281US7831949B2Method of designing semiconductor integrated circuit, designing apparatus, semiconductor integrated circuit system, semiconductor integrated circuit mounting substrate, package and semiconductor integrated circuitPANASONIC CORP·Filed 2007·Granted Nov 9, 2010·9 cites·41 claims
- 0379US7225418B2Operation analyzing method for semiconductor integrated circuit device, analyzing system used in the same, and optimization design method using the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted May 29, 2007·25 cites·38 claims
- 0479US6718529B1Method for calculation of cell delay timeMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Apr 6, 2004·27 cites·8 claims
- 0576US7107557B2Method for calculation of cell delay time and method for layout optimization of semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Sep 12, 2006·20 cites·2 claims
- 0676US6629299B1Delay library representation method, delay library generation method and delay calculation method using the delay libraryMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Sep 30, 2003·23 cites·6 claims
- 0775US6278964B1Hot carrier effect simulation for integrated circuitsMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1998·Granted Aug 21, 2001·40 cites·46 claims
- 0874US6498515B2Semiconductor integrated circuit and method for designing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Dec 24, 2002·15 cites·14 claims
- 0973US6795802B2Apparatus and method for calculating temporal deterioration margin amount of LSI, and LSI inspection methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Sep 21, 2004·18 cites·15 claims
- 1070US6988254B2Method for designing semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Jan 17, 2006·17 cites·3 claims
- 1166US6938233B2Method and apparatus for designing semiconductor integrated circuit device based on voltage drop distributionMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Aug 30, 2005·12 cites·13 claims
- 1264US6047247AMethod of estimating degradation with consideration of hot carrier effectsMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1997·Granted Apr 4, 2000·47 cites·9 claims
- 1360US7925998B2Delay calculating method in semiconductor integrated circuitPANASONIC CORP·Filed 2005·Granted Apr 12, 2011·2 cites·8 claims
- 1446US6038397ASystem for allocating the memory area of second data which value need not be preserved to another data of some of the processesMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1995·Granted Mar 14, 2000·20 cites·6 claims
- 1545US2006242612A1A crosstalk checking method using paralled line length extractionMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Application pending·0 cites
- 1644US2011012260A1Method of designing semiconductor integrated circuit, designing apparatus, semiconductor integrated circuit system, semiconductor integrated circuit mounting substrate, package and semiconductor integrated circuitPANASONIC CORP·Filed 2010·Application pending·0 cites
- 1744US2011185327A1Delay calculating method in semiconductor integrated circuitPANASONIC CORP·Filed 2011·Application pending·0 cites
- 1839US2005232066A1Method for characterizing cells with consideration for bumped waveform and delay time calculation method for semiconductor integrated circuits using the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2005·Application pending·0 cites
- 1938US2004158421A1Crosstalk checking methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Application pending·0 cites
- 2033US5761081AMethod of evaluating signal propagation delay in logic integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Jun 2, 1998·8 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →