Inventor · disambiguated record
Noriyuki Kaneoka
Also filed as: KANEOKA NORIYUKI
17 granted patents·4 pending applications·362 citations·filing 1990–2019
94Inventor score
Top patents by PatentIndex Score
21 records- 0199US8779400B2Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sampleHITACHI HIGH TECH CORP·Filed 2013·Granted Jul 15, 2014·91 cites·12 claims
- 0295US7700931B2Ion beam processing apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted Apr 20, 2010·20 cites·9 claims
- 0393US8481980B2Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sampleSHICHI HIROYASU·Filed 2008·Granted Jul 9, 2013·17 cites·11 claims
- 0488US7777183B2Charge particle beam system, sample processing method, and semiconductor inspection systemHITACHI HIGH TECH CORP·Filed 2007·Granted Aug 17, 2010·13 cites·16 claims
- 0588US7592606B2Manufacturing equipment using ION beam or electron beamHITACHI HIGH TECH CORP·Filed 2007·Granted Sep 22, 2009·11 cites·22 claims
- 0683US11002687B2Defect inspection method and defect inspection deviceHITACHI HIGH TECH CORP·Filed 2016·Granted May 11, 2021·2 cites·10 claims
- 0782US11193895B2Semiconductor substrate for evaluation and method using same to evaluate defect detection sensitivity of inspection deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Dec 7, 2021·2 cites·15 claims
- 0878US8431891B2Dual beam apparatus with tilting sample stageSHICHI HIROYASU·Filed 2010·Granted Apr 30, 2013·3 cites·20 claims
- 0978US6094647APresearch type document search method and apparatusHITACHI LTD·Filed 1997·Granted Jul 25, 2000·66 cites·10 claims
- 1077US5519857AHierarchical presearch type text search method and apparatus and magnetic disk unit used in the apparatusHITACHI LTD·Filed 1992·Granted May 21, 1996·59 cites·8 claims
- 1175US5659174AScanning electron microscopeHITACHI LTD·Filed 1996·Granted Aug 19, 1997·40 cites·9 claims
- 1270US10923315B2Charged particle beam apparatus, and method of adjusting charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2017·Granted Feb 16, 2021·1 cites·11 claims
- 1367US5168533AHierarchical presearch type text search method and apparatus and magnetic disk unit used in the apparatusHITACHI LTD·Filed 1990·Granted Dec 1, 1992·37 cites·56 claims
- 1457US2013320209A1Ion beam processing apparatusHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 1556US7696496B2Apparatus for ion beam fabricationHITACHI HIGH TECH CORP·Filed 2007·Granted Apr 13, 2010·0 cites·16 claims
- 1655US11515121B2Electron beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Nov 29, 2022·0 cites·10 claims
- 1749US2007158560A1Charged particle beam system, semiconductor inspection system, and method of machining sampleHITACHI HIGH TECH CORP·Filed 2006·Application pending·0 cites
- 1847US2006284115A1Ion beam apparatus and analysis methodKANEOKA NORIYUKI·Filed 2006·Application pending·0 cites
- 1945US10522320B2Charged particle beam device and method for adjusting charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Dec 31, 2019·0 cites·9 claims
- 2044US11107655B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Aug 31, 2021·0 cites·14 claims
- 2135US2019079025A1Defect Inspection DeviceHITACHI HIGH TECH CORP·Filed 2016·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Noriyuki Kaneoka files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →