Inventor · disambiguated record
Noboru Okino
Also filed as: OKINO NOBORU
6 granted patents·140 citations·filing 1985–2009
84Inventor score
Top patents by PatentIndex Score
6 records- 0184US6877118B2Memory testing method and memory testing apparatusADVANTEST CORP·Filed 2001·Granted Apr 5, 2005·42 cites·9 claims
- 0280US5410687AAnalyzing device for saving semiconductor memory failuresADVANTEST CORP·Filed 1993·Granted Apr 25, 1995·53 cites·14 claims
- 0359US4670879APattern generatorTAKEDA RIKEN IND CO LTD·Filed 1985·Granted Jun 2, 1987·19 cites·8 claims
- 0457US5140176ASequential logic circuit deviceADVANTEST CORP·Filed 1991·Granted Aug 18, 1992·21 cites·3 claims
- 0546US6836863B2Semiconductor memory testing method and apparatusADVANTEST CORP·Filed 2001·Granted Dec 28, 2004·5 cites·13 claims
- 0630US8207744B2Testing apparatusOKINO NOBORU·Filed 2009·Granted Jun 26, 2012·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →