Inventor · disambiguated record
Nobusuke Seki
Also filed as: SEKI NOBUSUKE
3 granted patents·54 citations·filing 1998–2007
70Inventor score
Files withADVANTEST CORP3
Top patents by PatentIndex Score
3 records- 0184US6586924B1Method for correcting timing for IC tester and IC tester having correcting function using the correcting methodADVANTEST CORP·Filed 2000·Granted Jul 1, 2003·38 cites·18 claims
- 0260US7656177B2Test apparatusADVANTEST CORP·Filed 2007·Granted Feb 2, 2010·2 cites·9 claims
- 0335US6064248AClock pulse transmission circuitADVANTEST CORP·Filed 1998·Granted May 16, 2000·14 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →