Inventor · disambiguated record
Noritsugu Takahashi
Also filed as: TAKAHASHI NORITSUGU
27 granted patents·3 pending applications·143 citations·filing 2004–2021
95Inventor score
Top patents by PatentIndex Score
30 records- 0195US7449690B2Inspection method and inspection apparatus using charged particle beamHITACHI HIGH TECH CORP·Filed 2006·Granted Nov 11, 2008·28 cites·20 claims
- 0292US8841612B2Charged particle beam microscopeFUKUDA MUNEYUKI·Filed 2011·Granted Sep 23, 2014·12 cites·5 claims
- 0392US7462828B2Inspection method and inspection system using charged particle beamHITACHI HIGH TECH CORP·Filed 2006·Granted Dec 9, 2008·18 cites·30 claims
- 0489US8153969B2Inspection method and inspection system using charged particle beamFUKADA ATSUKO·Filed 2008·Granted Apr 10, 2012·16 cites·7 claims
- 0587US8389935B2Charged particle beam apparatus permitting high-resolution and high-contrast observationFUKUDA MUNEYUKI·Filed 2009·Granted Mar 5, 2013·7 cites·12 claims
- 0686US11257658B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Feb 22, 2022·3 cites·7 claims
- 0784US8431915B2Charged particle beam apparatus permitting high resolution and high-contrast observationFUKUDA MUNEYUKI·Filed 2012·Granted Apr 30, 2013·4 cites·13 claims
- 0884US6821801B1Manufacturing method of semiconductor laser diodeHITACHI LTD·Filed 2004·Granted Nov 23, 2004·20 cites·15 claims
- 0982US8026481B2Charged particle apparatus, scanning electron microscope, and sample inspection methodHITACHI HIGH TECH CORP·Filed 2007·Granted Sep 27, 2011·6 cites·7 claims
- 1078US7956324B2Charged particle beam apparatus for forming a specimen imageHITACHI HIGH TECH CORP·Filed 2008·Granted Jun 7, 2011·5 cites·11 claims
- 1177US8785890B2Charged particle beam apparatus permitting high-resolution and high-contrast observationHITACHI HIGH TECH CORP·Filed 2013·Granted Jul 22, 2014·2 cites·13 claims
- 1275US10134558B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2015·Granted Nov 20, 2018·2 cites·8 claims
- 1375US7847249B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted Dec 7, 2010·4 cites·18 claims
- 1474US8209135B2Wafer inspection data handling and defect review toolFUNAKOSHI TOMOHIRO·Filed 2011·Granted Jun 26, 2012·4 cites·10 claims
- 1573US8735814B2Electron beam deviceSOHDA YASUNARI·Filed 2011·Granted May 27, 2014·3 cites·16 claims
- 1671US9159533B2Charged particle beam apparatus permitting high-resolution and high-contrast observationHITACHI HIGH TECH CORP·Filed 2014·Granted Oct 13, 2015·1 cites·15 claims
- 1768US8467595B2Defect review system and method, and programTAKAHASHI NORITSUGU·Filed 2009·Granted Jun 18, 2013·4 cites·5 claims
- 1866US9960006B2Charged-particle-beam deviceHITACHI HIGH TECH CORP·Filed 2015·Granted May 1, 2018·1 cites·14 claims
- 1964US8405026B2Charged particle beam apparatusSHOJO TOMOYASU·Filed 2009·Granted Mar 26, 2013·2 cites·3 claims
- 2058US9230775B2Charged particle instrumentOHASHI TAKEYOSHI·Filed 2012·Granted Jan 5, 2016·1 cites·14 claims
- 2157US8859962B2Charged-particle microscopeHITACHI HIGH TECH CORP·Filed 2014·Granted Oct 14, 2014·0 cites·7 claims
- 2255US11456150B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2021·Granted Sep 27, 2022·0 cites·5 claims
- 2352US9443695B2Charged-particle beam deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Sep 13, 2016·0 cites·11 claims
- 2451US9312091B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Apr 12, 2016·0 cites·11 claims
- 2551US2012004879A1Charged particle apparatus, scanning electron microscope, and sample inspection methodFUKUDA MUNEYUKI·Filed 2011·Application pending·0 cites
- 2650US2007105245A1Wafer inspection data handling and defect review toolHITACHI HIGH TECH CORP·Filed 2006·Application pending·0 cites
- 2749US11276551B2Inspection deviceHITACHI LTD·Filed 2020·Granted Mar 15, 2022·0 cites·15 claims
- 2845US10559450B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2018·Granted Feb 11, 2020·0 cites·12 claims
- 2943US2012119087A1Charged-particle microscopeTAKAHASHI NORITSUGU·Filed 2010·Application pending·0 cites
- 3038US10707047B2Measuring device and measuring methodHITACHI HIGH TECH CORP·Filed 2016·Granted Jul 7, 2020·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →