Inventor · disambiguated record
Noam Tal
Also filed as: TAL NOAM
23 granted patents·5 pending applications·75 citations·filing 2007–2025
93Inventor score
Top patents by PatentIndex Score
28 records- 0196US10341046B2Configurable constellation mapping to control spectral efficiency versus signal-to-noise ratioINTEL CORP·Filed 2017·Granted Jul 2, 2019·19 cites·33 claims
- 0293US11763181B2Metrology and process control for semiconductor manufacturingNOVA LTD·Filed 2021·Granted Sep 19, 2023·3 cites·20 claims
- 0392US8159377B2System, method, and circuitry for blind timing mismatch estimation of interleaved analog-to-digital convertersGOLDMAN NAOR·Filed 2010·Granted Apr 17, 2012·27 cites·20 claims
- 0490US9634795B2Configurable constellation mapping to control spectral efficiency versus signal-to-noise ratioINTEL CORP·Filed 2014·Granted Apr 25, 2017·9 cites·18 claims
- 0589US11133915B2Cable modem and digital compensation for switchable analog filter to assist echo cancellation in full duplex cable modemMAXLINEAR INC·Filed 2019·Granted Sep 28, 2021·7 cites·16 claims
- 0689US10491249B2Method and apparatus for self-interference cancelation in a full duplex networkINTEL CORP·Filed 2018·Granted Nov 26, 2019·8 cites·23 claims
- 0780US12236364B2Metrology and process control for semiconductor manufacturingNOVA LTD·Filed 2023·Granted Feb 25, 2025·0 cites·18 claims
- 0876US12321102B2Machine and deep learning methods for spectra-based metrology and process controlNOVA LTD·Filed 2023·Granted Jun 3, 2025·0 cites·18 claims
- 0976US2025334887A1Machine and deep learning methods for spectra-based metrology and process controlNOVA LTD·Filed 2025·Application pending·0 cites
- 1075US11093840B2Metrology and process control for semiconductor manufacturingNOVA MEASURING INSTR LTD·Filed 2019·Granted Aug 17, 2021·1 cites·16 claims
- 1175US2025181941A1Metrology and process control for semiconductor manufacturingNOVA LTD·Filed 2025·Application pending·0 cites
- 1272US11665040B2Configurable constellation mapping to control spectral efficiency versus signal-to-noise ratioINTEL CORP·Filed 2021·Granted May 30, 2023·0 cites·18 claims
- 1366US11075713B2Configurable constellation mapping to control spectral efficiency versus signal-to-noise ratioINTEL CORP·Filed 2019·Granted Jul 27, 2021·0 cites·28 claims
- 1465US11815819B2Machine and deep learning methods for spectra-based metrology and process controlNOVA LTD·Filed 2021·Granted Nov 14, 2023·0 cites·17 claims
- 1562US10848267B2Configurable constellation mapping to control spectral efficiency versus signal-to-noise ratioINTEL CORP·Filed 2018·Granted Nov 24, 2020·0 cites·20 claims
- 1660US10158451B2Configurable constellation mapping to control spectral efficiency versus signal-to-noise ratioINTEL CORP·Filed 2017·Granted Dec 18, 2018·0 cites·29 claims
- 1758US11463126B2Signaling method for interference group discovery in cable modemsINTEL CORP·Filed 2020·Granted Oct 4, 2022·0 cites·17 claims
- 1856US7746965B2Automatic gain control for a wideband signalTEXAS INSTRUMENTS INC·Filed 2007·Granted Jun 29, 2010·1 cites·20 claims
- 1953US10742264B2Signaling method for interference group discovery in cable modemsINTEL CORP·Filed 2017·Granted Aug 11, 2020·0 cites·14 claims
- 2048US8781052B2Physical layer channel synchronization method for high bit-rate cable transmissionsARAMBEPOLA BERNARD·Filed 2012·Granted Jul 15, 2014·0 cites·32 claims
- 2147US12469124B2Machine learning based yield predictionAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Granted Nov 11, 2025·0 cites·20 claims
- 2247US2025123571A1Full-wafer metrology up-samplingNOVA LTD·Filed 2023·Application pending·0 cites
- 2347US2025086781A1Machine learning based defect examination for semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 2446US12489020B2End-to-end measurement for semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Dec 2, 2025·0 cites·20 claims
- 2545US8976904B2Automated erasure slicer threshold control and modification of symbol estimates to be erasedINTEL CORP·Filed 2012·Granted Mar 10, 2015·0 cites·28 claims
- 2642US11874606B2System and method for controlling measurements of sample's parametersNOVA LTD·Filed 2021·Granted Jan 16, 2024·0 cites·26 claims
- 2739US9170968B2Device, system and method of multi-channel processingINTEL CORP·Filed 2012·Granted Oct 27, 2015·0 cites·17 claims
- 2835US2020244505A1Clock synchronization and ofdm symbol timing synchronization algorithm and architecture for data over cable service interface specification (docsis) full duplex (fdx) cable modem (cm) to enable fast recovery of downstream channels following an extended downstream freezeINTEL CORP·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →