Inventor · disambiguated record
Nobuhiko Umezu
Also filed as: UMEZU NOBUHIKO
20 granted patents·5 pending applications·159 citations·filing 1982–2021
94Inventor score
Top patents by PatentIndex Score
25 records- 0178US7820531B2Method of manufacturing semiconductor device, method of manufacturing display apparatus, apparatus of manufacturing semiconductor device, and display apparatusSONY CORP·Filed 2008·Granted Oct 26, 2010·6 cites·9 claims
- 0272US8193008B2Method of forming semiconductor thin film and semiconductor thin film inspection apparatusUMEZU NOBUHIKO·Filed 2009·Granted Jun 5, 2012·4 cites·20 claims
- 0372US6537637B2Multilayer optical diskSONY CORP·Filed 2001·Granted Mar 25, 2003·6 cites·19 claims
- 0471US8168518B2Method for crystallizing thin film, method for manufacturing thin film semiconductor device, method for manufacturing electronic apparatus, and method for manufacturing display deviceUMEZU NOBUHIKO·Filed 2008·Granted May 1, 2012·3 cites·13 claims
- 0570US6673639B2Method and system for evaluating polysilicon, and method and system for fabricating thin film transistorSONY CORP·Filed 2002·Granted Jan 6, 2004·13 cites·24 claims
- 0670US6241843B1Multilayer optical diskSONY CORP·Filed 1998·Granted Jun 5, 2001·15 cites·10 claims
- 0770US5766717AMultilayer optical diskSONY CORP·Filed 1996·Granted Jun 16, 1998·27 cites·13 claims
- 0869US6933185B2Polysilicon evaluating method, polysilicon inspection apparatus and method for preparation of thin film transistorSONY CORP·Filed 2003·Granted Aug 23, 2005·11 cites·4 claims
- 0969US4477821ALight modulating apparatusSONY CORP·Filed 1982·Granted Oct 16, 1984·14 cites·20 claims
- 1060US12191569B2Wave control medium, wave control element, wave control device, and method for manufacturing wave control mediumSONY GROUP CORP·Filed 2021·Granted Jan 7, 2025·0 cites·15 claims
- 1158US8404498B2Method of inspecting semiconductor thin film by transmission imaging and inspection device for the sameAMAGO HIROHISA·Filed 2009·Granted Mar 26, 2013·2 cites·14 claims
- 1257US8729650B2Solid-state imaging device and method of fabricating the sameHARADA KOUICHI·Filed 2008·Granted May 20, 2014·0 cites·7 claims
- 1354US6798498B2Apparatus for evaluating polysilicon filmSONY CORP·Filed 2002·Granted Sep 28, 2004·8 cites·9 claims
- 1452US6240111B1Laser beam generating apparatus and methodSONY CORP·Filed 1999·Granted May 29, 2001·18 cites·14 claims
- 1552US5862163AApparatus for generating ultraviolet laser radiationSONY CORP·Filed 1997·Granted Jan 19, 1999·19 cites·9 claims
- 1651US8518756B2Method for crystallizing thin film, method for manufacturing thin film semiconductor device, method for manufacturing electronic apparatus, and method for manufacturing display deviceUMEZU NOBUHIKO·Filed 2012·Granted Aug 27, 2013·0 cites·13 claims
- 1750US2005252894A1Laser annealing device and method for producing thin-film transistorSONY CORP·Filed 2005·Application pending·0 cites
- 1848US8253142B1Solid-state imaging device and method of fabricating the sameHARADA KOUICHI·Filed 2000·Granted Aug 28, 2012·2 cites·1 claims
- 1947USRE40136EMultilayer optical diskSONY CORP·Filed 2005·Granted Mar 4, 2008·0 cites·19 claims
- 2045US5989670AMultilayer optical diskSONY CORP·Filed 1998·Granted Nov 23, 1999·4 cites·29 claims
- 2145US2012231559A1Method of forming semiconductor thin film and semiconductor thin film inspection apparatusUMEZU NOBUHIKO·Filed 2012·Application pending·0 cites
- 2241US2004097103A1Laser annealing device and thin-film transistor manufacturing methodFiled 2002·Application pending·0 cites
- 2338US5741595AUltraviolet optical part having coat of ultraviolet optical thin film, and wavelength-changing device and ultraviolet light source unit having coat of ultraviolet optical thin filmSONY CORP·Filed 1996·Granted Apr 21, 1998·7 cites·9 claims
- 2438US2001038105A1Polysilicon evaluating method, polysilicon inspection apparatus and method for preparation of thin film transistorFiled 2001·Application pending·0 cites
- 2537US2010197050A1Method of forming semiconductor thin film and inspection device of semiconductor thin filmSONY CORP·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →