Inventor · disambiguated record
Nobuei Washizu
Also filed as: WASHIZU NOBUEI
10 granted patents·7 pending applications·42 citations·filing 2004–2025
87Inventor score
Top patents by PatentIndex Score
17 records- 0190US11181504B2Measurement apparatusADVANTEST CORP·Filed 2019·Granted Nov 23, 2021·4 cites·13 claims
- 0280US8373433B2Test apparatus, test method and manufacturing methodADVANTEST CORP·Filed 2010·Granted Feb 12, 2013·5 cites·13 claims
- 0371US7193407B2Test apparatus and testing methodADVANTEST CORP·Filed 2006·Granted Mar 20, 2007·5 cites·9 claims
- 0470US7190155B2Test apparatus and testing methodADVANTEST CORP·Filed 2005·Granted Mar 13, 2007·5 cites·7 claims
- 0566US2025297985A1Pore chip caseADVANTEST CORP·Filed 2025·Application pending·0 cites
- 0666US2025010292A1Microfluidic device and microparticle measurement systemADVANTEST CORP·Filed 2024·Application pending·0 cites
- 0765US2024125688A1Pore device and fine particle measurement systemADVANTEST CORP·Filed 2023·Application pending·0 cites
- 0864US2024183769A1Pore chip and microparticle measurement systemADVANTEST CORP·Filed 2023·Application pending·0 cites
- 0962US2025305929A1Pore deviceADVANTEST CORP·Filed 2025·Application pending·0 cites
- 1060US8605825B2Receiving apparatus, test apparatus, receiving method and test methodWASHIZU NOBUEI·Filed 2011·Granted Dec 10, 2013·2 cites·14 claims
- 1160US7913002B2Test apparatus, configuration method, and device interfaceADVANTEST CORP·Filed 2004·Granted Mar 22, 2011·9 cites·9 claims
- 1259US2022252544A1Fine particle measuring systemADVANTEST CORP·Filed 2022·Application pending·0 cites
- 1357US7759927B2Test apparatus and testing methodADVANTEST CORP·Filed 2006·Granted Jul 20, 2010·2 cites·7 claims
- 1457US6992576B2Test device and test moduleADVANTEST CORP·Filed 2004·Granted Jan 31, 2006·8 cites·12 claims
- 1553US7973584B2Waveform generatorADVANTEST CORP·Filed 2008·Granted Jul 5, 2011·2 cites·6 claims
- 1634US2012013343A1Receiving apparatus, test apparatus, receiving method, and test methodWASHIZU NOBUEI·Filed 2011·Application pending·0 cites
- 1729US8897395B2Clock generating apparatus, test apparatus and clock generating methodWASHIZU NOBUEI·Filed 2011·Granted Nov 25, 2014·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →