Inventor · disambiguated record
Oleg P. Kishkovich
Also filed as: KISHKOVICH OLEG · KISHKOVICH OLEG P
20 granted patents·6 pending applications·866 citations·filing 1997–2011
96Inventor score
Top patents by PatentIndex Score
26 records- 0198US6096267ASystem for detecting base contaminants in airEXTRACTION SYSTEMS INC·Filed 1997·Granted Aug 1, 2000·529 cites·24 claims
- 0293US7400383B2Environmental control in a reticle SMIF podENTEGRIS INC·Filed 2006·Granted Jul 15, 2008·43 cites·31 claims
- 0388USRE44536EFilters employing both acidic polymers and physical-adsorption mediaKISHKOVICH OLEG P·Filed 2011·Granted Oct 15, 2013·8 cites·50 claims
- 0487US6740147B2Filters employing both acidic polymers and physical-adsorption mediaEXTRACTION SYSTEMS INC·Filed 2001·Granted May 25, 2004·32 cites·55 claims
- 0585US6207460B1Detection of base contaminants in gas samplesEXTRACTION SYSTEMS INC·Filed 1999·Granted Mar 27, 2001·46 cites·18 claims
- 0683US7540901B2Filters employing both acidic polymers and physical-adsorption mediaENTEGRIS INC·Filed 2006·Granted Jun 2, 2009·12 cites·34 claims
- 0781US7014693B2Filters employing both acidic polymers and physical-adsorption mediaMYKROLIS CORP·Filed 2004·Granted Mar 21, 2006·21 cites·34 claims
- 0880US6761753B2Methods using filters employing both acidic polymers and physical-adsorption mediaEXTRACTION SYSTEMS INC·Filed 2002·Granted Jul 13, 2004·20 cites·20 claims
- 0979US8776841B2System for purging reticle storageKISHKOVICH OLEG P·Filed 2007·Granted Jul 15, 2014·10 cites·21 claims
- 1079US8398753B2System and method for removing contaminantsSERGI JOHN E·Filed 2005·Granted Mar 19, 2013·17 cites·40 claims
- 1179US6610128B2Filters employing porous strongly acidic polymersEXTRACTION SYSTEMS INC·Filed 2002·Granted Aug 26, 2003·15 cites·14 claims
- 1274US6447584B1Filters employing porous strongly acidic polymersEXTRACTION SYSTEMS INC·Filed 1999·Granted Sep 10, 2002·31 cites·13 claims
- 1373US7922791B2Filtering system for a semiconductor processing toolENTEGRIS INC·Filed 2007·Granted Apr 12, 2011·5 cites·21 claims
- 1473US6296806B1Protection of semiconductor fabrication and similar sensitive processesEXTRACTION SYSTEMS INC·Filed 1997·Granted Oct 2, 2001·33 cites·45 claims
- 1570US6855557B2Detection of base contaminants in gas samplesEXTRACTION SYSTEMS INC·Filed 2001·Granted Feb 15, 2005·12 cites·20 claims
- 1669US7022164B2Filters employing porous strongly acidic polymersMYKROLIS CORP·Filed 2003·Granted Apr 4, 2006·7 cites·19 claims
- 1767US7092077B2System and method for monitoring contaminationENTEGRIS INC·Filed 2003·Granted Aug 15, 2006·9 cites·16 claims
- 1865US6620630B2System and method for determining and controlling contaminationEXTRACTION SYSTEMS INC·Filed 2001·Granted Sep 16, 2003·8 cites·21 claims
- 1957US7329308B2Air handling and chemical filtration system and methodENTEGRIS INC·Filed 2004·Granted Feb 12, 2008·5 cites·25 claims
- 2053US2008257159A1Air handling and chemical filtration system and methodENTEGRIS INC·Filed 2008·Application pending·0 cites
- 2152US6759254B2System and method for determining and controlling contaminationEXTRACTION SYSTEMS INC·Filed 2002·Granted Jul 6, 2004·3 cites·11 claims
- 2252US2005106737A1Protection of semiconductor fabrication and similar sensitive processesEXTRACTION SYSTEMS INC·Filed 2004·Application pending·0 cites
- 2347US2011114129A1Methods and apparatuses for controlling contamination of substratesENTEGRIS INC·Filed 2008·Application pending·0 cites
- 2447US2008009099A1System and method of monitoring contaminationKISHKOVICH OLEG P·Filed 2006·Application pending·0 cites
- 2539US2002090735A1Protection of semiconductor fabrication and similar sensitive processesEXTRACTION SYSTEMS INC·Filed 2001·Application pending·0 cites
- 2637US2004023419A1System and method for monitoring contaminationEXTRACTION SYSTEMS INC·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →