Inventor · disambiguated record
Omer Abubaker Omer Adam
Also filed as: ADAM OMER ABUBAKER OMER
13 granted patents·1 pending application·86 citations·filing 2013–2022
91Inventor score
Files withASML NETHERLANDS BV14
Top patents by PatentIndex Score
14 records- 0198US11204239B2Metrology method, target and substrateASML NETHERLANDS BV·Filed 2020·Granted Dec 21, 2021·7 cites·36 claims
- 0297US11428521B2Metrology method, target and substrateASML NETHERLANDS BV·Filed 2021·Granted Aug 30, 2022·3 cites·29 claims
- 0397US10718604B2Metrology method, target and substrateASML NETHERLANDS BV·Filed 2019·Granted Jul 21, 2020·6 cites·22 claims
- 0497US9134256B2Metrology method and apparatus, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2013·Granted Sep 15, 2015·29 cites·17 claims
- 0596US9804504B2Method and apparatus for design of a metrology targetASML NETHERLANDS BV·Filed 2016·Granted Oct 31, 2017·13 cites·20 claims
- 0695US9355200B2Method and apparatus for design of a metrology targetASML NETHERLANDS BV·Filed 2014·Granted May 31, 2016·16 cites·20 claims
- 0794US10386176B2Metrology method, target and substrateASML NETHERLANDS BV·Filed 2015·Granted Aug 20, 2019·5 cites·20 claims
- 0887US10042268B2Method, apparatus and substrates for lithographic metrologyASML NETHERLANDS BV·Filed 2014·Granted Aug 7, 2018·5 cites·20 claims
- 0982US12429328B2Metrology method, target and substrateASML NETHERLANDS BV·Filed 2022·Granted Sep 30, 2025·0 cites·20 claims
- 1080US10073357B2Measuring a process parameter for a manufacturing process involving lithographyASML NETHERLANDS BV·Filed 2015·Granted Sep 11, 2018·2 cites·13 claims
- 1170US11320745B2Measuring a process parameter for a manufacturing process involving lithographyASML NETHERLANDS BV·Filed 2020·Granted May 3, 2022·0 cites·20 claims
- 1257US2019018326A1Measuring a Process Parameter for a Manufacturing Process Involving LithographyASML NETHERLANDS BV·Filed 2018·Application pending·0 cites
- 1355US9719945B2Metrology method and apparatus, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2015·Granted Aug 1, 2017·0 cites·20 claims
- 1454US11016397B2Source separation from metrology dataASML NETHERLANDS BV·Filed 2016·Granted May 25, 2021·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →