Inventor · disambiguated record
Ondrej Machek
Also filed as: MACHEK ONDREJ · MACHEK ONDŘEJ
4 granted patents·5 pending applications·0 citations·filing 2019–2025
53Inventor score
Files withFEI CO9
Top patents by PatentIndex Score
9 records- 0175US2025348669A1Large language model assistance for charged-particle microscope operationFEI CO·Filed 2024·Application pending·0 cites
- 0275US2025348670A1Large language model assistance for charged-particle microscope operationFEI CO·Filed 2024·Application pending·0 cites
- 0374US2025348668A1Large language model assistance for charged-particle microscope operationFEI CO·Filed 2024·Application pending·0 cites
- 0460US12223752B2Data acquisition in charged particle microscopyFEI CO·Filed 2021·Granted Feb 11, 2025·0 cites·15 claims
- 0560US2025322677A1Data acquisition in charged particle microscopyFEI CO·Filed 2025·Application pending·0 cites
- 0655US12211666B2Data acquisition and processing techniques for three-dimensional reconstructionFEI CO·Filed 2021·Granted Jan 28, 2025·0 cites·17 claims
- 0755US11901155B2Method of aligning a charged particle beam apparatusFEI CO·Filed 2021·Granted Feb 13, 2024·0 cites·18 claims
- 0849US11355305B2Low keV ion beam image restoration by machine learning for object localizationFEI CO·Filed 2019·Granted Jun 7, 2022·0 cites·20 claims
- 0949US2023108313A1Data triage in microscopy systemsFEI CO·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →