Inventor · disambiguated record
Oren Lahav
Also filed as: LAHAV OREN
3 granted patents·3 pending applications·9 citations·filing 2010–2024
60Inventor score
Top patents by PatentIndex Score
6 records- 0192US11353799B1System and method for error reduction for metrology measurementsKLA CORP·Filed 2020·Granted Jun 7, 2022·5 cites·25 claims
- 0273US11347045B2Ptychography based system and methodTECHNION RES & DEVELOPMENT FOUND LTD·Filed 2018·Granted May 31, 2022·4 cites·28 claims
- 0372US2024337952A1System and method for determining overlay measurement of a scanning targetKLA CORP·Filed 2023·Application pending·0 cites
- 0465US2025257992A1Metrology measurements on small targets with control of zero-order side lobesKLA CORP·Filed 2024·Application pending·0 cites
- 0562US2025138435A1Massive measurement sampling using multiple chucks and optical columnsKLA CORP·Filed 2023·Application pending·0 cites
- 0638US8581165B2Optomechanical MEMS device including a proof mass and an illumination mitigating mechanismRONEN AVIV·Filed 2010·Granted Nov 12, 2013·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →